聚焦离子束技术(FocusedIon beam,FIB)是利用电透镜将离子束聚焦成非常小尺寸的离子束轰击材料表面,实现材料的剥离、沉积、注入、切割和改性。随着纳米科技的发展,纳米尺度制造业发展迅速,而纳米加工就是纳米制造业的核心部分,纳米加工的代表性方法就是聚焦离子束。近年来发展起来的聚焦离子束技术(FIB)利用高强度聚焦离子...
我们今天使用的聚焦离子束(Focused ion beam,FIB)仪器的技术起源于外太空,更确切地说,是应用离子束推进航天器。在太空中,只有通过喷射物质(即所谓的reaction mass)才能产生推力。除了基于燃烧的化学推进器外,离子推进器已成为高精度运动的重要工具。 备注:在物理学和工程学中,"reaction mass"(反应物质)指的是在航天...
网络聚焦离子束 网络释义 1. 聚焦离子束 fib是什么意思_fib在线翻译... ... 5. abbr.focused-ion-beam;聚焦离子束6. abbr. forward information base; 转发信息库 ... danci.911cha.com|基于 1 个网页 释义: 全部,聚焦离子束
a如果成功, If succeeds,[translate] aA prayer for the wild at heart,kept in cages 用狂放的一个祷告在心脏,保留在笼子[translate] a我们一起演讲 We lecture together[translate] a外交顾问 Diplomatic consultant[translate] afocused ion beam 被聚焦的离子束[translate]...
Focused Ion Beam System (FIB/FIB-SEM) Lineup Focused Ion and Electron Beam System Ethos NX5000 The Hitachi Ethos FIB-SEM incorporates the latest-generation FE-SEM with superb beam brightness and stability. Ethos delivers high-resolution imaging at low voltages combined with ion optics for ...
Focused Ion Beam System (FIB/FIB-SEM) Lineup Focused Ion and Electron Beam System Ethos NX5000 The Hitachi Ethos FIB-SEM incorporates the latest-generation FE-SEM with superb beam brightness and stability. Ethos delivers high-resolution imaging at low voltages combined with ion optics for ...
FIB的应用Focused Ion Beam 聚焦离子束显微镜 (Focused Ion Beam, FIB) 聚焦离子束显微镜是运用镓 (Ga) 金属来做为离子源。因为镓的熔点为 29.76°C,且在此时的蒸气压为«10-13 Torr,所以很适合在真空下操作。在…
Ritchey, Focused ion beam-shaped micro- tools for ultra-precision machining of cylindrical components, Precis. Eng. 27 (Jan) (2003) 59-69.Y.N.Picard,D.P.Adams,M.J.Vasile,et al.Focused ion beam-shaped microtools for ultra-precision machining of cylindrical components. Precision Engineering ....
Focused Ion Beam In subject area: Materials Science Focused Ion Beam Induced Deposition or Focused Electron Beam Induced Deposition are direct-write nanolithography techniques that make use of a focused beam of charged ions or electrons to pattern nanometer resolution materials at a specific location. ...
Dual Beam – FIBA Focused Ion Beam (FIB) instrument uses a finely focused ion beam to modify and image the sample of interest. FIB is chiefly used to create very precise cross sections of a sample for subsequent imaging via SEM, STEM or TEM or to perform circuit modification. Additionally...