Focused Ion Beam System (FIB/FIB-SEM) Lineup Focused Ion and Electron Beam System Ethos NX5000 The Hitachi Ethos FIB-SEM incorporates the latest-generation FE-SEM with superb beam brightness and stability. Ethos delivers high-resolution imaging at low voltages combined with ion optics for ...
Additionally, three-dimensional information can be obtained by combining the electron and ion beam operations to perform a tomography (i.e. mill a slice with ion beam, image with electron beam, and repeat). Generally, conductive samples are ideal for FIB and SEM because they do not collect ...
CollagenFIB-SEMMineralized boneThe mineralized collagen fibril is the basic building block of bone, and hence is the key to understanding bone structure and function. Here we report imaging of mineralized pig bone samples in 3D using the focused ion beam-scanning electron microscope (FIB-SEM) ...
The JIB-PS500i FIB-SEM Focused Ion Beam System represents the cutting edge in preparation, imaging, and analysis.
FIB的应用Focused Ion Beam 聚焦离子束显微镜 (Focused Ion Beam, FIB) 聚焦离子束显微镜是运用镓 (Ga) 金属来做为离子源。因为镓的熔点为 29.76°C,且在此时的蒸气压为«10-13 Torr,所以很适合在真空下操作。在…
聚焦离子束技术(FocusedIon beam,FIB)是利用电透镜将离子束聚焦成非常小尺寸的离子束轰击材料表面,实现材料的剥离、沉积、注入、切割和改性。随着纳米科技的发展,纳米尺度制造业发展迅速,而纳米加工就是纳米制造业的核心部分,纳米加工的代表性方法就是聚焦离子束。近年来发展起来的聚焦离子束技术(FIB)利用高强度聚焦离子...
Focused ion beam scanning electron microscopy (FIB SEM) instruments for automated structural analysis, TEM sample preparation, and nanoprototyping.
我们今天使用的聚焦离子束(Focused ion beam,FIB)仪器的技术起源于外太空,更确切地说,是应用离子束推进航天器。在太空中,只有通过喷射物质(即所谓的reaction mass)才能产生推力。除了基于燃烧的化学推进器外,离子推进器已成为高精度运动的重要工具。 备注:在物理学和工程学中,"reaction mass"(反应物质)指的是在航天...
FIB SEM instruments for automated structural analysis, TEM sample preparation, and nano-prototyping. Contact us Focused ion beam scanning electron microscopy Scientists and engineers in both academia and industry are constantly facing new challenges that require highly localized characterization of a wide ...
FIB制样。FIB制样是一种利用聚焦离子束(Focused Ion Beam, FIB)技术进行样品制备的方法。 以下是关于FIB制样的一些详细信息: 1. 原理:FIB技术通过将液态金属(通常是镓Ga)的离子源产生的离子束经过加速和聚焦后照射到样品表面,可以产生二次电子信号以取得电子图像。同时,使用较高电流的离子束可对表面原子进行物...