X-ray thin-film measurement techniques IV. In-plane XRD measurements1. IntroductionX-ray diffraction intensities from a thin film deposited on a substrate can be relatively weak in comparing to the enormous X-ray diffraction and background intensities from its substrate. The in-plane XRD technique...
6, where the dashed line 3 X-ray thin-?lm measurement techniques VI Fig 6. Size distributions of Ni nano particle. Fig 7. The schematic of a submicron-scale grooves on sample surface. shows a result analyzed from the pro?le from GI-SAXS with the in-plane geometry, i.e. the size ...
X-ray photoelectron spectroscopy (XPS) is a popular analytical technique in materials science as it can assess the surface chemistry of a broad range of samples. This Primer concerns best practice in XPS analysis, aimed at both entry-level and advanced users, with a focus on thin film samples...
thin film, as opposed to the average film polarity, to be probed directly. The X-ray standing wave technique provides the average Ti and Ba atomic positions, along the out-of-plane direction, near the surface of three differently strainedBaTiO3thin films. This technique gives direct access to...
in Ta2O5layers for large area (>1 cm2) flat thin-film (TFT-TaC) and nano-porous sintered Ta (NP-TaC) capacitors. Considerable differences in NP-TaC vs. TFT-TaC geometries (and therefore kVp X-ray absorption) were accounted for, giving rise to similar temporal and IV-curve ...
Similarly, many reflections, e.g., at 11.6° or 33.3°, could be used for calcium sulphate dihydrate in microcrystalline cellulose (iv). The reflection at 23.3° is on the slope of a broad amorphous profile of microcrystalline cellulose, but both can be deconvoluted. 2.4. LC-DAD and LC-QT...
Nondestructive testing (NDT) techniques in the measurement of residual stresses in composite materials: An overview Mahmood M. Shokrieh, A.R. Ghanei Mohammadi, in Residual Stresses in Composite Materials (Second Edition), 2021 3.2 The X-ray diffraction method The X-ray diffraction is a method ...
The accuracy of the absorption measurement is sufficient to allow systematic differences in orientation to be determined as a function of thin-film deposition conditions [81]. The spectroscopic information in near-edge x-ray absorption fine structure (NEXAFS) studies can be used to find subtle ...
such as a photodiode detector array, senses the X-rays reflected from the surface and produces an intensity signal as a function of reflection angle. The angle-dependent signal is analyzed to determine properties of the structure of a thin film layer on the sample, including thickness, density...
preferably configured to be small enough and thin enough to be placed inside the mouth, and the method of the present invention can be used to quantify bone mass using standard dental x-ray systems, for example by including temporary or permanent calibration phantoms in dental x-ray film ...