Thin Film Analysis by X-Ray Scattering (BIRKHOLZ:THIN FILM X-RAY O-BK) || Texture and Preferred Orientationtexture and preferred orientationtexture factorspole figuresmeasurement of pole figuresdepth dependence of thin‐film texturesdoi:10.1002/3527607595.ch5Birkholz...
(2006), Thin film analysis by X-ray scattering. By Mario Birkholz, with contributions by P. F. Fewster and C. Genzel. Pp. xxii+356. Weinheim: Wiley-VCH Verlag GmbH Co., 2005. Price (hardcover) EUR 119, SFR 188. ISBN-10: 3-527-31052-5; ISBN-13: 978-3-527-31052-4. J. ...
Thin Film Analysis by X-Ray Scattering 4.8 MB Rar'd PDF pass: gigapedia.org By Mario Birkholz * Publisher: Wiley-VCH * Number Of Pages: 378 * Publication Date: 2006-02-06 * Sales Rank: 919405 * ISBN / ASIN: 3527310525 * EAN: 9783527310524 * Binding: Hardcover * Manufacturer: Wiley-...
He is involved in the development of thin film systems for applications in photovoltaics, sensor technology and as protective coatings. His main scientific interest is focused on the structure and morphology of thin films, their investigation by x-ray scattering techniques and the relation between str...
Soft X-ray resonant magnetic scattering (SXRMS) was performed on a FePd alloy thin film at the L 3-edge of Fe. This film exhibits perpendicular magnetic an... G Beutier,A Marty,K Chesnel,... - 《Physica B-condensed Matter》 被引量: 20发表: 2004年 Measurement of the interior struct...
X-ray photoelectron spectroscopy (XPS) is a popular analytical technique in materials science as it can assess the surface chemistry of a broad range of samples. This Primer concerns best practice in XPS analysis, aimed at both entry-level and advanced users, with a focus on thin film samples...
Application of Monte Calro method for the fluorescence X-ray analysis of thin films. By applying the theoretical correction, the proposed fluorescent X-ray spectrometric method allows one to use a bulk specimen as a reference as well as the thin film and is effective for a nopdestructive analys...
An analysis technique for extraction of thin film stresses from x-ray data. Demonstrates a technique for determining stresses in crystalline thin films. Use of generalized focusing diffractometer; Measurement of interplanar spacing... Cornella,Guido,SH Lee - 《Applied Physics Letters》 被引量: 18...
... MR Alexander,GE Thompson,G Beamson - 《Surface & Interface Analysis》 被引量: 44发表: 2015年 Characterization of the Sb2O3 Thin Films by X-Ray Scattering Thin films of Sb2O3 have been prepared by thermal sputtering on a substrate of SiO2. The X ray scattering experiment from the...
X-ray fluorescence analysis of thin film structure comprises irradiating with primary X-ray beam to produce hard and soft secondary radiation which is measured and calculating e.g. thickness of chemical elementsA composite material sample comprising a silicon substrate coated with a 20-250 nm layer...