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X-Ray Scattering from Soft-Matter Thin Films: Materials Science and Basic Research, by Metin Tolan Beerlink, A.; Pflaum, K.; Seeck, O. H. M Ward 被引量: 0发表: 2000年 X-Ray Scattering from Thin Films and Multilayers Capability of the X-ray scattering for study of low-dimensional str...
Further, the study of concentration profiles in functionally graded hard-metals and investigation of the multilayer degradation caused by soft annealing are discussed.David RafajaEuropean Powder Diffraction ConferenceV. Holy, U. Pietsch, T. Baumbach, High Resolution X-Ray Scattering from Thin Films ...
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the
2g). The appearance of the distinct scattering peaks reveals the PNSs in the colloidal islands have long-range ordering, however, the radial distribution function (Supplementary Fig. 3) extracted from the corresponding SEM image (Fig. 2g) shows the PNSs are randomly distributed, which underscores...
While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists...
Small-angle scattering (SAS) is a technique that is able to probe the structural organization of matter and quantify its response to changes in external conditions. X-ray and neutron scattering profiles measured from bulk materials or materials deposited at surfaces arise from nanostructural inhomogenei...
The scattering diminishes the coherence of the X-rays, thereby decreasing the visibility of the stepping-curve, causing higher dark-field values in the resulting image. 2.3. Data Analysis To compare the image contrast of the letters against the paper, the dark-field and the attenuation images ...
(2006), Thin film analysis by X-ray scattering. By Mario Birkholz, with contributions by P. F. Fewster and C. Genzel. Pp. xxii+356. Weinheim: Wiley-VCH Verlag GmbH Co., 2005. Price (hardcover) EUR 119, SFR 188. ISBN-10: 3-527-31052-5; ISBN-13: 978-3-527-31052-4. J. ...
Ade, H. (2013), ChemInform Abstract: Characterization of Organic Thin Films with Resonant Soft X-Ray Scattering and Reflectivity Near the Carbon and Fluorine Absorption Edges. ChemInform, 44: no. doi: 10.1002/chin.201326247 Author Information Dep. Phys., N. C. State Univ., Youngsville, NC 27...