Thin Film Analysis by X-Ray Scattering (BIRKHOLZ:THIN FILM X-RAY O-BK) || Texture and Preferred Orientationtexture and preferred orientationtexture factorspole figuresmeasurement of pole figuresdepth dependence of thin‐film texturesdoi:10.1002/3527607595.ch5Birkholz...
(2006), Thin film analysis by X-ray scattering. By Mario Birkholz, with contributions by P. F. Fewster and C. Genzel. Pp. xxii+356. Weinheim: Wiley-VCH Verlag GmbH Co., 2005. Price (hardcover) EUR 119, SFR 188. ISBN-10: 3-527-31052-5; ISBN-13: 978-3-527-31052-4. J. ...
While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists...
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the
X-ray photoelectron spectroscopy (XPS) is a popular analytical technique in materials science as it can assess the surface chemistry of a broad range of samples. This Primer concerns best practice in XPS analysis, aimed at both entry-level and advanced users, with a focus on thin film samples...
An analysis technique for extraction of thin film stresses from x-ray data. Demonstrates a technique for determining stresses in crystalline thin films. Use of generalized focusing diffractometer; Measurement of interplanar spacing... Cornella,Guido,SH Lee - 《Applied Physics Letters》 被引量: 18...
Application of Monte Calro method for the fluorescence X-ray analysis of thin films. By applying the theoretical correction, the proposed fluorescent X-ray spectrometric method allows one to use a bulk specimen as a reference as well as the thin film and is effective for a nopdestructive analys...
... MR Alexander,GE Thompson,G Beamson - 《Surface & Interface Analysis》 被引量: 44发表: 2015年 Characterization of the Sb2O3 Thin Films by X-Ray Scattering Thin films of Sb2O3 have been prepared by thermal sputtering on a substrate of SiO2. The X ray scattering experiment from the...
An overview of X-ray scattering methods used for analysis of the real structure of thin films is presented that includes conventional diffraction, glancing angle X-ray diffraction, X-ray reflectivity measurement and grazing incidence X-r... D Rafaja - 《Advances in Solid State Physics》 被引量...
The sample is irradiated with a primary X-ray beam to produce 'hard' and 'soft' secondary radiation, which are both measured. The thickness and/or concentration of the chemical elements can then be calculated from the intensity measurements at the three radiation wavelengths. An Independent claim...