X-ray thin-film measurement techniques IV. In-plane XRD measurements1. IntroductionX-ray diffraction intensities from a thin film deposited on a substrate can be relatively weak in comparing to the enormous X-ray diffraction and background intensities from its substrate. The in-plane XRD technique...
6, where the dashed line 3 X-ray thin-?lm measurement techniques VI Fig 6. Size distributions of Ni nano particle. Fig 7. The schematic of a submicron-scale grooves on sample surface. shows a result analyzed from the pro?le from GI-SAXS with the in-plane geometry, i.e. the size ...
X-ray thin-film measurement techniques V. X-ray reflectivity measurement DOI:https://doi.org/10.1103/PhysRev.50.97 M Yasaka 被引量: 38发表: 2010年 Rapid X-ray reflectivity measurement using a new liquid interface reflectometer at SPring-8 X-ray reflectivity measurements of liquid surfaces were ...
The protective layer's main purpose is to guard the emulsion layers below, which is softer. In simpler terms, it is a skin of gelatin that is thin and guards the film from cuts during handling. For film manufacturers, it has significant properties including shrinkage (during drying, it forms...
techniques A0130R Reviews and tutorial papers resource letters A6855 Thin film growth, structure, and epitaxy A6865 Low-dimensional structures: growth, structure and nonelectronic properties A8170 Materials testing A6848 Solid-solid interfaces A4630R Mechanical measurement methods and techniques for ...
M. Thin Film and Surface Character- ization by Specular X-Ray Reflectivity. Crit. Rev. Solid State Mater. Sci. 1997, 22 (1), 1-67.E. Chason and T. M. Mayer. Thin film and surface characterization by specular X-ray reflectivity. Critical Reviews in Solid State and Ma- terials ...
Stress measurement of CVD diamond films A review of common stress measurement techniques as related to CVD diamond is presented. A correction to the commonly applied Stoney thin film equation for... H Windischmann,KJ Gray - 《Diamond & Related Materials》 被引量: 213发表: 1995年 Residual stres...
Integrating poly-silicon and InGaZnO thin-film transistors for CMOS inverters. IEEE Trans. Electron. Devices 64, 3668–3671 (2017). Google Scholar Fenter, P., Park, C., Zhang, Z. & Wang, S. Observation of subnanometre-high surface topography with X-ray reflection phase-contrast microscopy....
In this work, we illustrate the principle of XFH for a thin-film waveguide and demonstrate that when applied to a film consisting of fluorescence substances, it becomes an in situ and time-resolved imaging technique with sub-nanometer spatial resolution—X-ray waveguide fluorescence holography (XWF...
He is involved in the development of thin film systems for applications in photovoltaics, sensor technology and as protective coatings. His main scientific interest is focused on the structure and morphology of thin films, their investigation by x-ray scattering techniques and the relation between str...