The in-plane XRD technique with a grazing incident x-ray beam has been used successfully to enhance the thin-film intensities and to minimize the substrate intensities in the analysis a thin-film(1).Three-dimensional thin-film structure, such as preferred orientation (or texture), orientational ...
Invariant embedding theoretical results for the recorded x-ray intensities in electron probe microanalysis were used to develop a procedure for thin films. The method presented here gives the possibility of achieving thin-film characterization directly from characteristic x-rays intensities measurements, wit...
X-ray photoelectron spectroscopy (XPS) is a popular analytical technique in materials science as it can assess the surface chemistry of a broad range of samples. This Primer concerns best practice in XPS analysis, aimed at both entry-level and advanced users, with a focus on thin film samples...
ray diffraction/ A6110F Experimental X-ray diffraction and scattering techniques A0130R Reviews and tutorial papers resource letters A6855 Thin film growth, structure, and epitaxy A6865 Low-dimensional structures: growth, structure and nonelectronic properties A8170 Materials testing A6848 Solid-solid ...
alternative to more hazardous surgery or, for some types of diseases, including those that are life threatening; they are the sole method of treatment (More detailed description of technology and techniques for interventional radiology can be found in Chapter 2.14 on X-ray and ultrasound imaging.)...
The base, emulsion, and protective coating are the three main portions that creates an x-ray film: • The base A base on which the other materials are applied exists in all x-ray films. Usually the base is prepared from a flexible, clear plastic such ascellulose acetate. Supporting the...
Similar to X-ray fluorescence holography for crystals, where holograms are formed through the interference between the reference and the object waves, we demonstrated that an ultrathin film, being an X-ray waveguide, can also generate fluorescence holograms as a result of the establishment of X-...
M. Thin Film and Surface Character- ization by Specular X-Ray Reflectivity. Crit. Rev. Solid State Mater. Sci. 1997, 22 (1), 1-67.E. Chason, and T. M. Mayer, "Thin Film and Surface Characterization by Specular X-Ray Reflectivity", Critical Reviews in Solid State und Materials ...
X-ray reflectivity (XRR), a technique related to X-ray diffraction (XRD), is becoming a widely used tool for thecharacterizationof thin-film and multilayer structures. X-ray scattering at very small diffraction angles allows characterization of the electron density profiles of thin films down to...
In this study, we demonstrate that the X-ray standing wave technique allows the surface polarization profile of a ferroelectric thin film, as opposed to the average film polarity, to be probed directly. The X-ray standing wave technique provides the average Ti and Ba atomic positions, along ...