The in-plane XRD technique with a grazing incident x-ray beam has been used successfully to enhance the thin-film intensities and to minimize the substrate intensities in the analysis a thin-film(1).Three-dimensional thin-film structure, such as preferred orientation (or texture), orientational ...
6, where the dashed line 3 X-ray thin-?lm measurement techniques VI Fig 6. Size distributions of Ni nano particle. Fig 7. The schematic of a submicron-scale grooves on sample surface. shows a result analyzed from the pro?le from GI-SAXS with the in-plane geometry, i.e. the size ...
The base, emulsion, and protective coating are the three main portions that creates an x-ray film: • The base A base on which the other materials are applied exists in all x-ray films. Usually the base is prepared from a flexible, clear plastic such ascellulose acetate. Supporting the...
PROBLEM TO BE SOLVED: To provide an X-ray reflectivity measurement device capable of measuring the reflectivity of a thin film or the like provided on a substrate and performing evaluation by X-ray reflection XAFS. SOLUTION: This X-ray reflectivity measurement device passes an X-ray beam turned...
ray diffraction/ A6110F Experimental X-ray diffraction and scattering techniques A0130R Reviews and tutorial papers resource letters A6855 Thin film growth, structure, and epitaxy A6865 Low-dimensional structures: growth, structure and nonelectronic properties A8170 Materials testing A6848 Solid-solid ...
Similar to X-ray fluorescence holography for crystals, where holograms are formed through the interference between the reference and the object waves, we demonstrated that an ultrathin film, being an X-ray waveguide, can also generate fluorescence holograms as a result of the establishment of X-...
In this paper, we report on two fast and non-destructive methods for nanostructured film density evaluation based on a combination of energy dispersive x-ray spectroscopy for areal density measurement and scanning electron microscopy (SEM) for thickness evaluation. These techniques have been applied to...
A correction to the commonly applied Stoney thin film equation for... H Windischmann,KJ Gray - 《Diamond & Related Materials》 被引量: 213发表: 1995年 Residual stress measurements of thin aluminum metallizations by continuous indentation and x-ray stress measurement techniques Stress relaxation in...
The X-ray camera uses the same film technology as an ordinary camera, but X-ray light sets off the chemical reaction instead of visible light. (See How Photographic Film Works to learn about this process.) Generally, doctors keep the film image as a negative. That is, the areas that ...
Thin Film and Surface Characterization by Specular X-Ray Reflectivity. Critical Reviews - Chason, Mayer - 1997Chason, E.; Mayer, T. M. Thin Film and Surface Character- ization by Specular X-Ray Reflectivity. Crit. Rev. Solid State Mater. Sci. 1997, 22 (1), 1-67....