Thin Film Analysis by X-Ray Scattering (BIRKHOLZ:THIN FILM X-RAY O-BK) || Texture and Preferred Orientationtexture and preferred orientationtexture factorspole figuresmeasurement of pole figuresdepth dependence of thin‐film texturesdoi:10.1002/3527607595.ch5Birkholz...
(2006), Thin film analysis by X-ray scattering. By Mario Birkholz, with contributions by P. F. Fewster and C. Genzel. Pp. xxii+356. Weinheim: Wiley-VCH Verlag GmbH Co., 2005. Price (hardcover) EUR 119, SFR 188. ISBN-10: 3-527-31052-5; ISBN-13: 978-3-527-31052-4. J. ...
While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists...
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6.9.2 X-ray Penetration Depth for the General Case of Asymmetric Diffraction 278 6.9.3 Special Methods for X-ray Stress Gradient Analysis 281 6.9.4 Grazing-Incidence Diffraction (GID) 282 6.9.5 The Scattering Vector Method 284 6.9.6 Realization of H Mode on a Four-Circle Diffractometer 286 ...
Analysis of mesoporous thin films by X-ray reflectivity,optical reflectivity and grazing inci dence small angle X-ray scattering[J]. Applied Surface Science, 2006,253(1) ;3-11.A. Gibaud S. Dourdain and G. Vignaud.Analysis of mesoporous thin films by X-ray reflectivity, optical reflectivity ...
Soft X-ray resonant magnetic scattering (SXRMS) was performed on a FePd alloy thin film at the L 3-edge of Fe. This film exhibits perpendicular magnetic an... G Beutier,A Marty,K Chesnel,... - 《Physica B-condensed Matter》 被引量: 20发表: 2004年 Measurement of the interior struct...
approximately±10pmaccuracy13,14,15,18,28. However, neither of the above methods provides spectroscopic information on atoms in ferroelectric thin films and adsorbate species. This could be achieved by X-ray photoelectron diffraction, however, at the expense of rather complex multiple-scattering ...
X-ray photoelectron spectroscopy (XPS) is a popular analytical technique in materials science as it can assess the surface chemistry of a broad range of samples. This Primer concerns best practice in XPS analysis, aimed at both entry-level and advanced users, with a focus on thin film samples...
Application of Monte Calro method for the fluorescence X-ray analysis of thin films. By applying the theoretical correction, the proposed fluorescent X-ray spectrometric method allows one to use a bulk specimen as a reference as well as the thin film and is effective for a nopdestructive analys...