事实就是，因为做完scan chain reordering后相邻的寄存器连线很近，势必会引起hold的违例较之前的多。但是，EDA tool 不仅支持place过程的scan chain reordering，也支持clock_opt阶段的scan chain reordering。所以在place阶段用了scan chain reordering之后，务必在clock_opt阶段继续做进一步的优化，减少hold violation的数...
clock edge mixed: 如果在插scan chain 时enable 了clock edge mix, 工具会尽量将所有负沿触发的寄存器放在chain 的前半段,把正沿触发的寄存器放在chain 的后半段;如果要将正沿触发的寄存器放在负沿触发的寄存器前面,则需要在rise edge->fall edge 过度的两个寄存器之间插一个lockup latch, 否则在做scan shift ...
第二步中scan合成又包括四步:1)Scan configuration;2)Scan replacement就是把电路中的normal时序单元(DFF)替换为一个scan时序单元(SDFF);3)Scan Reordering物理实现时,在不同的scan cell间可以进行重新排序;4)scan stitching将scan cell缝合到一起,每一个scan cell的output连接到下一级的input,组成scan chain。 sc...
1 Scan插入过程 扫描链的插入(Scan insertion),在芯片功能设计完成后,即为将整个网表由一堆普通寄存器替换为扫描寄存器的过程,这样新加入的寄存器和原有寄存器一同构成scan chain并参与对芯片的测试;扫描插入的流程分为四个步骤:扫描配置、扫描替换、扫描缝合和扫描链的插入。 2 扫描配置 扫描配置(Configure scan sett...
A method for reordering a scan chain so that the given constraints are met and the peak power dissipation is minimized and disclosed. The constraints include a maximum peak power dissipation, a maximum scan chain length and a maximum distance between two successive registers. The developed tool ...
扫描链的插入(Scan insertion),在芯片功能设计完成后,即为将整个网表由一堆普通寄存器替换为扫描寄存器的过程,这样新加入的寄存器和原有寄存器一同构成scan chain并参与对芯片的测试;扫描插入的流程分为四个步骤:扫描配置、扫描替换、扫描缝合和扫描链的插入。
反应scan chain中scan cell的reorder。在物理实现之前,一个random的scan order被design使用。 在进行physical implementation时,scan order可以使用intra_scan_chain reordering(scan cell只在该scan chain内进行reorder)和inter_scan_chain reordering(scan cell在不同的scan chain之间reorder) ...
Scan Chain Reordering: In Ref. [66], the order of scan cells is dynamically reconfigured by an unpredictable scrambler, which increases the routing overhead significantly. In Ref. [67], each scan chain is divided into several segments, and then the test controller determines the segments' scan...
Scan chain reordering is widely used method to reduce test power. In this paper, a Hamming distance based distributed reordering for loading and unloading scan chain vector is proposed. This method focuses on how and where weighted transitions occur. In current scenario of VLSI the manufacturing ...
Then, scan chain reordering 1708 is conducted. After that, the HDL test benches and tester programs 1711 are generated while all reports and errors are saved in the report files 1712. FIG. 18 shows a flow chart of the method for generating broadcast scan patterns used in testing scan-based...