这是一个简单的脚本,读design (综合后),读library ,加时钟 design check 开始 做scan 写两个文件给ATPG用 2.问题来了如果design里面既有 posedeg clk 又有negedge clk ,那么该如何做scan ,使用上面的脚本还行吗... 查看原文 5. DFT进阶——ATPG delay testing ATPG过程首先会进行DRC check ,其中clock ...
A scan chain comprising a series of flip-flops and two clock signals, where each clock signal is coupled to alternating flip-flops in the series. The second clock signal is typically 180 degrees out of phase with the first clock signal. The two clock signals may be generated from a base ...
2. DFT 入门篇-scan chain—design rule check clock domain 我们又该如何处理 第2种可能出现问题(频率一样,相位不一样) 这个时候我们添加 lockup cell 相当于添加数据的保持时间 注意这里添加的位置. 4 。scan相关信号 主要是要注意第四个 5. 做scan的时候我们首先需要进行 scan rule check 如果失败,两种方...
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Design for Testability (DFT) is a subject covering a huge amount material. The 1983 survey by Williams and Parker [Will83] is still remarkably current in its enumeration of DFT techniques (it lacks Boundary-Scan of course), but many of the contexts have
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Several methods exist for minimising posterior energy. The comparative study in [29] recommends two approaches, graph-cuts (GC) [30] and message passing, e.g. belief propagation (BP) [31], as efficient and powerful. Since our energy function is neither metric nor semi-metric, GC is not ...
A method of securing a design-for-test scan chain within a programmable integrated circuit device (IC) can include placing the programmable IC in an operational mode and responsive
For use with a design database and a timing database, a computer implemented process for electronic design automation comprising: receiving a netlist that includes cells interconnected by circuit paths, wherein a plurality of the cells are scan cells connected in at least one scan chain; ordering...
A structural design-for-test for diagnosing broken scan chain defects of long non-scannable register chains (GPTR) The GPTR and the system for testing and diagnosing the broken LSSD