反应scan chain中scan cell的reorder。在物理实现之前,一个random的scan order被design使用。 在进行physical implementation时,scan order可以使用intra_scan_chain reordering(scan cell只在该scan chain内进行reorder)和inter_scan_chain reordering(scan cell在不同的scan chain之间reorder) scan stitching 将所有的scan ...
Scan chain reordering based on physical design information helps in reducing routing bottleneck and in minimizing design constraint violations. This paper ... M Hirech,J Beausang,X Gu - International Test Conference 被引量: 86发表: 1998年 A Technique to Reduce Peak Current and Average Power Dissi...
1 Introduction and Motivation In VLSI design for testability, a scan chain is commonly used to connect the shift registers that store the input and output vectors during the testing phase of manufacturing. Registers in the scan chain are connected as a single path, with ends of the path ...
Disclosed is a method and apparatus for improved delay fault testing by optimizing the order of scan cells in a scan chain. The order of the scan cells is determined by using a cost
An efficient algorithm to reduce test power consumption by scan cell and scan vector reordering consumption by scan cell and scan vector reordering - Reddy, Chattopadahyay - 2004 () Citation Context ...since it is independent of clock frequency. ......
the connections it makes to these chains. Due to lock-up latch insertion, reordering of scan chains doesn’t happen and the start and stop elements of a chain are not allowed to sit together resulting in sub-optimal placement of LBIST controller which in turn aggravates the design Congestion....