Single-capture是一种slow-speed test的技术,只需要一个capture pulse.测试intra-clock-domain和inter-clock-domain的structural faults. 两种approaches来进行test. 1) One-Hot Single-Capture 在一个capture window下只需要一个capture pulse,所以不用担心不同clock domain之间的clock skew,但是这种方式只能test intra-...
last_shift launch mode (低速测试) system_clock launch mode ( launch on capture) 1.at speed test structure and OCC Controller 2.OCC Controller 当使用set_dft_configuration -clock_controller enable运行insert_dft DFT编译器会将DFT_clk_mux和DFT_clk_chain组件添加到网表中。 2.1OCC Controller的结构 ①...
The device includes and utilizes a built in self test controller to generate test sequences, and a clock-gating circuit to selectively supply the test sequences to a memory input or memory output on the core under test. After an initial data initialization of the core under test at built ...
文章首先介绍了at-speed测试的故障模型,以及具体测试方法,然后详细介绍了采用PLL时钟作为at-speed测试时钟时,一款芯片的at-speed测试实现方案,最后采用Fastscan及TestKompress对整个设计进行了测试向量自动生成及向量压缩。实验结果表明此方案可行,采用TestKompress进行设计更符合目前的设计需求。关键字:At-speed测试;可测...
[3].ForDSMdesigns,thestuck-atfaulttestalone cannotensurehighqualitylevelofchips.Inthepast,functional patternswereusedforat-speedtest.However,functionaltest- ingisnotaviablesolutionbecauseofthedifficultyandtime togeneratethesetestsforcomplexdesignswithveryhighgate density.Therefore,morerobustat-speedtechniquesare...
At-speed test using on-chip controller 优质文献 相似文献 参考文献 引证文献An On-Chip Test Clock Control Scheme for Multi-Clock At-Speed Testing To test timing-related faults between synchronous clocks, an at-speed test clock and an automatic test pattern generation scheme are needed. However, ...
Delay Test Generation Techniques for Compact SDD Pattern Volume High SDD Coverage and Speed Binning we propose novel testing techniques including: (1) TDF pattern selection and pattern evaluation using critical faults; (2) Compact TDF pattern generation to maximize SDD coverage; (3) Worst-case path...
1) at-speed test 全速测试 1. It is necessary to adopt delay default models and implementat-speed testfor the faults caused by circuit propagation delay. 当工艺进入到超深亚微米以下,传统的故障模型不再适用,必须对电路传输延迟引发的故障采用延迟故障模型进行全速测试。
For two-pattern at-speed scan testing, the excessive power supply noise at the launch cycle may cause the circuit under test to malfunction, leading to yield loss. This paper proposes a new weight assignment scheme for logic switching activity; it enhances the IR-drop assessment capability of ...
supplied by theinventors: "The IEEE 1149.1 Test Access Port (TAP) is used widely in the semiconductor industry as an ICinterface for controlling many types of embedded IC circuits, such as but not limited to test circuits, debugcircuits, programming circuits, instrumentation circuits and trace ...