last_shift launch mode (低速测试) system_clock launch mode ( launch on capture) 1.at speed test structure and OCC Controller 2.OCC Controller 当使用set_dft_configuration -clock_controller enable运行insert_dft DFT编译器会将DFT_clk_mux和DFT_clk_chain组件添加到网表中。 2.1OCC Controller的结构 ①...
At-speed testDesign-For-Test (DFT) techniques for acquiring fail bit map of at-speed function with conventional wafer test equipment are proposed. SRAM core is operated with high-frequency clock generated by gain-suppressed VCO which can reduce clock jitter. The data are outputted with data ...
Single-capture是一种slow-speed test的技术,只需要一个capture pulse.测试intra-clock-domain和inter-clock-domain的structural faults. 两种approaches来进行test. 1) One-Hot Single-Capture 在一个capture window下只需要一个capture pulse,所以不用担心不同clock domain之间的clock skew,但是这种方式只能test intra-...
A Lphc X-Filling Framework For Capture Power Reduction During Speed Scan Testing Launch off shift(loSAutomatic test pattern generation(ATPGDesign for test ability(DFTTest compression has become a de-facto technique in VLSI testing. Test... DR Ganesan - 《Journal of Engineering Computers & Applied...
In this paper we present a Design-For-Test (DFT) technique implemented on a high speed VLSI device that allows us to use a low speed/cost tester to perform at-speed scan transition and path delay testing. The concept is to:-• Use an i... EH Freescale,CD Renfrew,RG Freescale 被引...
如果不同的时钟域之间有确定的相位关系和 时序要求, 也可进行时钟域之间的”at-speed”的测试.同样的芯片设计,Fastscan 一般可以提供较高的 测试覆盖率以保证测试质量; 同时, Fastscan 在测试向量压缩方面效果最好; 而且其运行时间也比其他 ATPG 工具要快上数倍。 · 设计师开始 SOC 设计时, 必须对 DFT 给予...
Design for AT-speed Test, Diagnosis and Measurement 作者:Nadeau-Dostie, Benoit 编 出版年:1999-9 页数:256 定价:$ 202.27 ISBN:9780792386698 豆瓣评分 目前无人评价 评价: 写笔记 写书评 加入购书单 分享到 + 加入购书单
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[α-P2W18O62]6- anion within the hexagonal station helps make the channel very hydrophilic and lures lots of guest liquid particles to fill-in the free space, conducive to proton transport. Therefore, the single-crystal test of just one displays a high proton conductivity of 6.39 × 10-3 ...
The "slower" storage depicted in the testing were actually SSDs, while the "faster" storage was by leveraging PernixData FVP and distributed fault tolerant memory (DFTM) as a storage acceleration tier. The absolute numbers are not necessarily important for this testing. The focus is more about...