Scan-chain Optimization Methods for VLSIThis paper presents a scan-chain optimization method for multiple scan-paths. The pro- posed method first determines pairs of scan-in and scan-out pins u8ing pin locations. Then, flip-flops are assigned to the pairs by a graph theoretical method, and ...
它通过TAP控制器、扫描链和测试模式生成器的协同工作,实现了对芯片内部功能和连通性的全面测试。 C. M. Piguet, in VLSI Design Techniques for Analog and Digital Circuits, 2021
扫描输入(Scan In, SI); 扫描输出(Scan Out, SO) 但是一般情况下SO和Q复用一个pin,其结构如下图: scan设计的结构如下图所示,将scan DFF的Q端和SI端连接,多个scan DFF就组成了一个scan chain。在实际的芯片设计中,将普通DFF替换成scan DFF并串成scan chain这两步操作都是由工具自动完成。 上图是没加组合...
Scan chain (SC) is a widely used technique in recent VLSI chips to ease the test process of these chips. SCs enhance the observability and controllability of memory elements such as latches and flip-flops used in sequential parts of the chips. In this paper we propose a novel scan chain ...
10.3Scan chain diagnosis Scan chainstructures are widely used inVLSIcircuits under design for testing. They increase the fault coverage and diagnosability by enhancing the controllability andobservabilityof the digitalcircuit logic[362].Fig. 13shows the design of a preliminary scan chain. During normal...
原文地址:vlsitutorials.com/dft-s, 后附英文原文 芯片制造厂家的工艺一般多多少少会导致芯片存在一些缺陷(defects),这些缺陷通常被称为故障(fault)。如果有详细定义的测试流程能够让这些故障在实际硅片上暴露出来,那么这些故障被认为是可测试的(testable)。为了能够在测试中尽可能检测到多的故障,我们需要在测试中增加...
Scan chain design for shift power reduction in scan-based testing Test power of VLSI systems has become a challenging issue nowadays. The scan shift power dom- inates the average test power and restricts clock frequency o... LI Jia,HU Yu,LI Xiaowei - 《Science China(Information Sciences)》...
Scan chain design for shift power reduction in scan-based testing Test power of VLSI systems has become a challenging issue nowadays. The scan shift power dom- inates the average test power and restricts clock frequency o... LI Jia,HU Yu,LI Xiaowei - 《Science China(Information Sciences)》...
A novel scan chain diagnostics technique based on light emission from leakage current Scan chain diagnostics have become more important than ever due to the increasing complexity of VLSI designs, as more and more scan latches/flip-flops are ... P Song,F Stellari,T Xia,... - International ...
The basis for this paper is that if a failure occurs in the scan chain, irregular IDDQ current flow will occur and identify the defective chain. Moreover, the actual location of the failure inside the chain can also be ascertained. Then, with result of exemplification, I shall prove the ...