The proposed scan design realizes complete on-chip delay measurement in short measurement time using the proposed delay measurement technique and extra latches for storing the test vectors. Index terms: Very large scale integration (VLSI), signature register, design for testability (DFT). I.Teluk...
Design of Decompressor Using Cumulating Transmission Cyclic Shift Updating Compression Technique for Multiple Scan ChainsIn VLSI designs, the circuits are designed and then tested using DFT(Design for Testability) approach. Overall testability of the circuit can be improved using structured DFT. The ...
BIST FAULT DIAGNOSIS IN SCAN-BASED VLSI ENVIRONMENTS This paper presents a novel test point insertion technique which, unlike the previous ones, is based on a constructive methodology. A divide and conquer ap... N Telecom,PO Box,C Station,... 被引量: 59发表: 1996年 Gate Level Fault Diagno...
Built-in test for VLSI: Pseudo-Random Techniques. New York: Wiley, 1987 Google Scholar Koenemann B, Mucha J, Zwiehoff C. Built-in logic block observation technique. In: Proc. of IEEE Int. Test Conference. 1979. 37–41 Jas A, Krishna C V, Touba N A. Weighted pseudorandom hybrid ...
A systematic approach to the selection of locations for such test points in order to realize a target diagnostic resolution to the replaceable unit level is proposed. The approach is based on a combination of three models, a structural model for system interconnection and test signal propagation, ...
In this thesis, we propose a new approach for watermarking IP designs based on the embedding of the ownership proof as part of the IP design's finite... AT Abdel-Hamid 被引量: 23发表: 2006年 A Watermarking Technique for Hard IP Protection in Full-custom IC Design Intellectual property (...
“A New Probing Technique for High-Speed/High-Density Printed Circuit Boards”, Parker, K. P., Proceedings, International Test Conference, paper 13.1, Charlotte NC, Oct 2004 Google Scholar “Bead Probes in Practice”, Parker, K. P., Proceedings, International Test Conference, Austin TX, Nov...
Testing technique of interconnect network based on boundary scan is effective in solving these problems. 边界扫描互连网络测试技术是检测PCB板固定故障的一种有效方法。 cepd.66wen.com 8. This is the problem addressed by the IEEE standard number 1149 "Standard Test Access Port and Boundary-Scan Archite...
Scan-Architecture-Based Evaluation Technique of SET and SEU Soft-Error Rates at Each Flip-Flop in Logic VLSI Systems A scan flip-flop (FF) is designed to observe both single event transient (SET) and single event upset (SEU) soft errors in logic VLSI systems. The SET and ... Y Yanagawa...
Roughly described, a scan-based test architecture is optimized in dependence upon the circuit design under consideration. In one embodiment, a plurality of candidate test designs ar