The proposed scan design realizes complete on-chip delay measurement in short measurement time using the proposed delay measurement technique and extra latches for storing the test vectors. Index terms: Very large scale integration (VLSI), signature register, design for testability (DFT). I.Teluk...
A Low Hardware Overhead Self-Diagnosis Technique Using Reed-Solomon Codes for Self-Repairing Chips A self-diagnosis circuit that can be used for built-in self-repair is proposed. The circuit under diagnosis is assumed to be composed of a large number of ... X Tang,S Wang - 《IEEE Transac...
Peak and Average Power Reduction Technique For Digital Circuits Using Scan-Based BIST Technology provides smaller, faster and lower energy devices which allow more powerful and compact circuitry. Thermal and shot-noise estimations alone sugg... BS Rao,B Kondalu 被引量: 0发表: 0年 High-performance...
A systematic approach to the selection of locations for such test points in order to realize a target diagnostic resolution to the replaceable unit level is proposed. The approach is based on a combination of three models, a structural model for system interconnection and test signal propagation, ...
Practical/ boundary scan testing design for testability fault tolerant computing logic design logic testing security of data system-on-chip VLSI/ scan-based side-channel attack fault coverage chip scan test chip security strategy Lock & Key technique test security controller reverse engineering design-fo...
Scan-Architecture-Based Evaluation Technique of SET and SEU Soft-Error Rates at Each Flip-Flop in Logic VLSI Systems A scan flip-flop (FF) is designed to observe both single event transient (SET) and single event upset (SEU) soft errors in logic VLSI systems. The SET and ... Y Yanagawa...
Design and automation of VLSI architectures for bidirectional scan based fault localization approach in FPGA fabric aware cellular automata topologies In this paper, we have designed FPGA fabric aware CA circuit topologies with a built-in bidirectional scan chain to facilitate fine-grained fault ... ...
Rectifying Various Scan-based Attacks on Secure IC'S Some countermeasures have been proposed in order to secure the scan technique and on-chip comparison. In this paper, an additional inverter is introduced within the scan chain architecture. The introduction of flipped scan chain increases ... C...
Design of Decompressor Using Cumulating Transmission Cyclic Shift Updating Compression Technique for Multiple Scan ChainsIn VLSI designs, the circuits are designed and then tested using DFT(Design for Testability) approach. Overall testability of the circuit can be improved using structured DFT. The ...
This paper proposes a scan-cell reordering scheme, named ROBPR, to reduce the signal transitions during test mode while preserving the don't-care bits in the test patterns for a later optimization. Combined with a pattern-filling technique, the proposed scheme utilizes both response correlation an...