The proposed scan design realizes complete on-chip delay measurement in short measurement time using the proposed delay measurement technique and extra latches for storing the test vectors. Index terms: Very large scale integration (VLSI), signature register, design for testability (DFT). I.Telukutla SahithiPh. D
Design of Decompressor Using Cumulating Transmission Cyclic Shift Updating Compression Technique for Multiple Scan ChainsIn VLSI designs, the circuits are designed and then tested using DFT(Design for Testability) approach. Overall testability of the circuit can be improved using structured DFT. The ...
A systematic approach to the selection of locations for such test points in order to realize a target diagnostic resolution to the replaceable unit level is proposed. The approach is based on a combination of three models, a structural model for system interconnection and test signal propagation, ...
1.Research on Low-Power Test in VLSI Scan Test;VLSI扫描测试中的低功耗测试方法研究 2.Designing and Implementing a Boundary Scan Tester with USB Interface;基于USB总线的边界扫描测试仪的研制 3.Research on Boundary-scan Test Technique of Electronic Function Module;电子功能模件边界扫描测试技术研究 4.DC...
Scan-Architecture-Based Evaluation Technique of SET and SEU Soft-Error Rates at Each Flip-Flop in Logic VLSI Systems A scan flip-flop (FF) is designed to observe both single event transient (SET) and single event upset (SEU) soft errors in logic VLSI systems. The SET and ... Y Yanagawa...
Oracle-guided Attacks: While logic locking can be an effective technique to establish trust among different entities of the IC supply chain, it has not seen application due to its lack of attack resiliency. The logic locking is proved to be vulnerable against Oracle-guided attacks which will be...
Launch-off-shift (LOS) method provides higher fault coverage and lower pattern count when compared to launch-off-capture (LOC) method. Investigations have proven that some faults can be detected using LOC but not LOS and vice-versa. In LOS, the second pa
Design for Testability (DFT) is a subject covering a huge amount material. The 1983 survey by Williams and Parker [Will83] is still remarkably current in its enumeration of DFT techniques (it lacks Boundary-Scan of course), but many of the contexts have
Roughly described, a scan-based test architecture is optimized in dependence upon the circuit design under consideration. In one embodiment, a plurality of candidate test designs ar
This paper presents a diagnosis technique to locate hold-time (HT) faults and setup-time (ST) faults in scan chains. This technique achieves deterministic diagnosis results by applying thermometer scan input (TSI) patterns, which have only one rising or one falling transition. With TSI patterns,...