Experimental Verification of Scan-Architecture-Based Evaluation Technique of SET and SEU Soft-Error Rates at Each Flip-Flop in Logic VLSI Systems.doi:10.1109/TNS.2009.2020166integrated circuit radiation effectsIrradiation testlogic VLSI systemscan architecture...
Design of Decompressor Using Cumulating Transmission Cyclic Shift Updating Compression Technique for Multiple Scan ChainsIn VLSI designs, the circuits are designed and then tested using DFT(Design for Testability) approach. Overall testability of the circuit can be improved using structured DFT. The ...
In this thesis, we propose a new approach for watermarking IP designs based on the embedding of the ownership proof as part of the IP design's finite... AT Abdel-Hamid 被引量: 23发表: 2006年 A Watermarking Technique for Hard IP Protection in Full-custom IC Design Intellectual property (...
Launch-off-shift (LOS) method provides higher fault coverage and lower pattern count when compared to launch-off-capture (LOC) method. Investigations have proven that some faults can be detected using LOC but not LOS and vice-versa. In LOS, the second pattern (i.e. patternV2) is generated...
Test power of VLSI systems has become a challenging issue nowadays. The scan shift power dom- inates the average test power and restricts clock frequency of the shift phase, leading to excessive thermal accumulation and long test time. This paper proposes a scan chain design technique to solve...
This is much easier to accomplish if a second–source agreement is based upon the exchange of design data (that can be re-synthesized) rather than based upon exchanging mask data. 37. SAMPLE and PRELOAD , in previous releases of the Standard since the beginning [IEEE90], were one instructio...
1. 边界扫描 边界扫描(Boundary-Scan)技术的基本思想是在靠近芯片的输入/输出引脚上增加一个移位寄存器单元,也就是边界扫描寄存器(… blog.csdn.net|基于165个网页 2. 边界扫描模式 3.2.3边界扫描模式(Boundary-Scan) 30 3.2.4 从并模式(Slave SelectMAP) 31 3.2.5 主并模式(Master SelectMAP) 32 第四章 ...
The technique scales well for very large designs. The hardware overhead is logarithmic in the number of scan cells and linear in the number of scan chains 展开 关键词: built-in self-test Scan Chains Design-for-Testability Design-for-Diagnosis Design-for-Debug Integrated Circuits LFSR Multi-...
Huang T-C, Lee K-J (2001) Reduction of power consumption in scan-based circuits during test application by an input control technique. IEEE TCAD 20(7):911–917, July Google Scholar Lee DH, McCluskey EJ (2005) Comparisons of various scan delay test techniques. SRC Report, Dec Nicolici...
Scan design oriented test technique for VLSI's using ATE This technique can be applied to standard boundary scan designs and to ad-hoc internal scan implementations. Furthermore, restrictions from limited tester ... Y Oyama,T Kanai,H Niijima - International Test Conference 被引量: 2发表: 2002...