原文地址:vlsitutorials.com/dft-s, 后附英文原文 芯片制造厂家的工艺一般多多少少会导致芯片存在一些缺陷(defects),这些缺陷通常被称为故障(fault)。如果有详细定义的测试流程能够让这些故障在实际硅片上暴露出来,那么这些故障被认为是可测试的(testable)。为了能够在测试中尽可能检测到多的故障,我们需要在测试中增加额外的
Observation of path delay faults requires propagation of transitions in a circuit which is done by application of pair of patterns. This paper proposes a single input change test pattern generator (SIC- TPG) that creates SIC pairs and hence can be used for path delay fault detection. The same...
The diagnosis of faults to replaceable units at the system or board level can be enhanced by selective insertion of serial scan shift registers as test points within or between the replaceable units. A systematic approach to the selection of locations for such test points in order to realize a...
“aspect” of the RTL, such as scan, power, or debug, which is not directly represented in the logic. These aspect-based behaviors are expected to be part of the final design, often through automatic insertion into the RTL or netlist during some stage of synthesis. In any such case, ...
Launch-off-shift (LOS) method provides higher fault coverage and lower pattern count when compared to launch-off-capture (LOC) method. Investigations have proven that some faults can be detected using LOC but not LOS and vice-versa. In LOS, the second pa
ScanPartialScanBuilt-inself-test(BIST)Boundaryscan DFTmethodformixed-signalcircuits:Analogtestbus Mar.30,2001 VLSITest:Bushnell-Agrawal/Lecture23 2 Ad-HocDFTMethodsAdGooddesignpracticeslearntthroughexperienceareusedasguidelines:Avoidasynchronous(unclocked)feedback.Makeflip-flopsinitializable.Avoidredundantgates....
Now the job is check the value of this flop in the capture phase. And analyze the Fan-in cone for the cause of the mismatch. Reactions: ashokvlsi A ashokvlsi Points: 2 Helpful Answer Positive Rating Feb 19, 2015 Mar 28, 2013 #5 M maulin sheth Advanced Member level 2 ...
(初始化设置?) 3.SCAN TEST(非常有用的哦) “FUNC… bangong.jiaokao.com|基于189个网页 3. 扫描设计 扫描设计(Scan Test)、边界扫描设计(JTAG)、BIST(Built In Self Test)等技术使得在同等测试品质下,测试难度及测试时间均得 … www.eet-china.com|基于3个网页...
removable connecting path means bridging the optional further path insertion means. 2. A video scan converter comprising: input means for receiving a video signal at a first scan rate, output means for providing said video signal at a second scan rate, ...
(VLSI) circuits increases, the testability of those circuits decreases. When testing the design of a VLSI chip, it is possible to trace signals through each circuit module and verify the correct behavior at each step. However, testing for manufacturing defects in this manner would be impractical...