它通过TAP控制器、扫描链和测试模式生成器的协同工作,实现了对芯片内部功能和连通性的全面测试。 C. M. Piguet, in VLSI Design Techniques for Analog and Digital Circuits, 2021
原文地址:https://vlsitutorials.com/dft-scan-and-atpg/, 后附英文原文芯片制造厂家的工艺一般多多少少会导致芯片存在一些缺陷(defects),这些缺陷通常被称为故障(fault)。如果有详细定义的测试流程能够让…
K. Saluja, "Sequential Test Generation with Reduced Test Clocks for Partial Scan Designs," in VLSI Test Symposium, pp. 220-225, April 1994.S. Y. Lee and K. K. Saluja, \Sequential test generation with reduced test clocks for partial scan designs," Proc. VLSI Test Symp., pp. 220-225...
At the same time, the increasing complexity and sophistication of VLSI/ULSI testers also require higher levels of tester expertise. It is difficult, if not impossible for today's test engineer to keep up with new testers every two to three years while trying to attain design level knowledge ...
A true single-phase clocking scheme for low-power and high-speed VLSI This paper describes a true-single-phase clocking scheme with charge-recycling differential logic (CRDL). The original CRDL circuit is modified for use w... Bai-Sun Kong,Young-Hyun Jun,K Lee - IEEE International Symposium...
VLSIDFTLFSRmultiple scan chainsIn Very Large Scale Integrated Circuits (VLSI) design, the existing Design-for-Test(DFT) based watermarking techniques usually insert watermark through reordering scan cells, which causes large resource overhead, low security and coverage rate of watermark detection. A ...
System Verilog Macro: A Powerful Feature for Design Verification Projects System Verilog Assertions Simplified UPF Constraint coding for SoC - A Case Study Enhancing VLSI Design Efficiency: Tackling Congestion and Shorts with Practical Approaches and PnR Tool (ICC2) PCIe error logging and...
VLSITest:Lecture23/19alt 1 Definition Designfortestability(DFT)referstothosedesign techniquesthatmaketestgenerationandtestapplicationcost-effective.DFTmethodsfordigitalcircuits:Ad-hocmethodsStructuredmethods: ScanPartialScanBuilt-inself-test(BIST)Boundaryscan Analogtestbus ...
- IEEE International Conference on Computer Design 被引量: 17发表: 2009年 Scan-Architecture-Based Evaluation Technique of SET and SEU Soft-Error Rates at Each Flip-Flop in Logic VLSI Systems A scan flip-flop (FF) is designed to observe both single event transient (SET) and single event ...
- Third International Conference on Constructive Side-channel Analysis & Secure Design 被引量: 30发表: 2012年 An Efficient Approach to Develop Secure Scan Tree for Crypto-Hardware Scan chain based test has been a common and useful method for testing VLSI designs due to its high controllability ...