We have simplified the probe card with a unique direct attach construction technique, eliminating the costly MLO space transformer while reducing the number of transmission line transitions. Field replaceable probes provide reduced downtime and world-class cost of ownership. 60 GHz bandwidth for mmWave...
探针卡(probe card)是晶圆测试(wafer test)中被测芯片(chip)和测试机之间的接口,主要用于芯片封装前对芯片的电学性能进行初步测试,并筛选出不良芯片后,再进行之后的封装工程,因此,探针卡的作用至关重要,属于半导体核心检测耗材。 下面我们就来介绍一下在半导体晶圆测试中的探针卡,以及探针卡的类型之一——垂直式探针...
When the probe card is fully assembled and the MLO™ is mounted on the PCB interface, the final ICCT test must be performed in order to test the integrity of each single connection between MLO™ and PCB interface itself. The PilotV8 XL HR Next> series will generate automatically the spe...
Flexnake™采用市面上最为成熟和稳定的结构设计,专门为Micro Bump/ Cu Pillar的焊锡球测试而设计,同时也可以支持Pre-Bump以及其他微小Pad的测试。 拥有广泛的探针材料可以选择,由Cobra蛇形针到高性能的MEMS探针制作垂直式探针卡,使用MLO+双层Guide Plate设计,探针垂直于DUT从而支持Area Array或者Semi Array等大多数悬...
Contact, 채용공고 More DESIGN, SIMULATION semicon test solution provider Our Story What's new... 1. Successful development completed, supply starting in January 2024. Probe card Mother Board for UFLEX DD+, V93K DD, M5 series, T2K, T583X Series usingBluetooth-based control technology....
Logic Test Probe Card Market Segment by Type: - Vertical Needle/tip - Thin Film MLO - Membrane Logic Test Probe CardLogic Test Probe Card Market Segment by Application: - SME - Large EnterpriseAccess full report and Get 25% Discount @ https://www.reportsnreports.com/contacts/discount.aspx?
Signed-off-by: Jisheng Zhang <jszhang@kernel.org> Acked-by: Gabriel Somlo <gsomlo@gmail.com> Fixes: 92e0991 ("mmc: Add driver for LiteX's LiteSDCard interface") Cc: stable@vger.kernel.org Link: https://lore.kernel.org/r/20230617085319.2139-1-jszhang@kernel.org Signed-off-by: Ulf...
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了解更多 特点Features 参数Specifications 参数表 Data Sheet 拥有直径25um ~ 75um 的MEMS探针可供选择 特殊针尖处理以降低接触阻抗 符合的MEMS探针技术采用使得CCC能力大幅提高,最高到1.2A 最低45umPitch支持 Multi Site 制作支持 制作前进行仿真可控制针压至0.8~1.5gf MLO采用使得高达150°C的高温测试成为可能 ...
得益于微纳加工技术,Pogo Pin的直径能够缩小到半导体晶圆测试级别,由于其拥有稳定的Over Drive 行程,内置微型弹簧,可以提供稳定的针压,良好均匀的接触性能,精准的Alignment对位,使得Spring Type Probe在垂直探针卡中占据重要位置。 了解详情 具有弹性的导线性探针垂直探针卡 ...