We begin with the development of a statistical model for path delay faults in VLSI circuits (Hamad, M. and Landis, D., A statistical model for path delay faults in VLSI circuits. In Proc. IEEE South East Conf. ,
We have already seen that the linear complexity and good finite precision properties of the structure make it a good candidate for VLSI implementation, however, as explained in Section. II C 2, the critical-path delay of the filter-structure constrains its maximum speed of operation, thus ...
In sub-20 nm, effect of miller capacitance on delay has jumped to more than 10 percent on a nominal delay of few hundred picoseconds and therefore can no longer be avoided. Ugly: Higher Variation There is a need to contain waveform distortion while sampling output and power-ground current ...
It is not an exaggeration to say that Intel's 10nm manufacturing miss had a huge impact on both the company and the overall state of competition in the x86 market. Intel brought22nm and FinFETsto market ahead of all of its competitors, but then had todelay its 14nm nodet...
dynamic fault model for multiple fault detections, such as the stuck-at or transition delay fault models, and avoids any path or path segment enumeration... S Neophytou,MK Michael,K Christou - IEEE International Symposium on Defect & Fault Tolerance in Vlsi Systems 被引量: 4发表: 2009年 Ap...
Transition faults and transition path delay faults: Test generation, path selection, and built-in generation of functional broadside tests. We first describe a deterministic broadside test generation procedure for a path delay fault model named the transition path delay fault model, which ... B Yao...
Since the CORDIC algorithm leads to a very regular structure suitable for VLSI implementation. In [10], it has been concluded that the length of the critical path, i.e. the maximum number of add...
This problem is augmented when additional requirements, such as good delivery probability or low end-to-end delay, are foreseen. Many routing protocols have been proposed up until now, and in some social network analysis is leveraged to enhance the delivery of messages. Some of the routing ...
52-5, entitled "Constrained Conditional Resource Sharing in Pipeline Synthesis". VLSI Design, vol. 6, No. 2, Feb. 1985, pp. 86-91 entitled "Path-Delay Computation Algorithms for VLSI Systems". IEEE Internatoinal Test Conference Proceedings 19-21 Nov. 1985, pp. 334-341 entitled "The ...
A BIST circuit for an IC measures the time delay a rising or falling edge experiences as it passes through a signal path within the IC. A strobe circuit within the BIST circuit gene