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Source: http://assist.dla.mil -- Downloaded: 2021-07-15T02:54ZCheck the source to verify that th... 文档格式:PDF | 页数:331 | 浏览次数:264 | 上传日期:2021-07-15 13:26:19 | 文档星级: AMSC N/A FSC 5961 INCH-POUND MIL−STD−750−2A w/CHANGE 5 4 March 2021 SUPERSED...
DLA-CC Reviewactivities: Army-AR,MI Navy-AS,CG,MC,SH AirForce–19,99 2 MIL-STD-750D NOTICE4 NumericalIndexofTestMethods METHODNO.TITLE Environmentaltests(1000series). 1001.2Barometricpressure(reduced). 1011.1Immersion. 1015.1Steady-stateprimaryphotocurrentirradiationprocedure(electronbeam). ...
DLA-CC Reviewactivities: Army-AR,MI Navy-AS,CG,MC,SH AirForce–19,99 2 MIL-STD-750D NOTICE4 NumericalIndexofTestMethods METHODNO.TITLE Environmentaltests(1000series). 1001.2Barometricpressure(reduced). 1011.1Immersion. 1015.1Steady-stateprimaryphotocurrentirradiationprocedure(electronbeam). 1016Insulation...
DLA MIL-STD-750 E-2006由美国国防后勤局 US-DLA 发布于 2006。 DLA MIL-STD-750 E-2006 在中国标准分类中归属于: L40 半导体分立器件综合,在国际标准分类中归属于: 31.080.01 半导体器分立件综合。 DLA MIL-STD-750 E-2006 半导体器件的试验方法标准的最新版本是哪一版? DLA MIL-STD-750 E-2006已经是...
半导体器件的测试方法标准高可靠性空间应用测试方法第5部分:测试方法 5000 至 5999 TEST METHOD STANDARD HIGH RELIABILITY SPACE APPLICATION TEST METHODS FOR SEMICONDUCTOR DEVICES PART 5: TEST METHODS 5000 THROUGH 5999 标准号 DLA MIL STD 750 5 F-2012 ...
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DLA MIL-STD-750 F-2012 半导体器件测试方法标准IEC 60747-9:2019 半导体器件第9部分:分立器件绝缘栅双极晶体管 MIL MIL-STD-750F-2012相似标准 MIL MIL-STD-750E-2006半导体器件测试方法(取代MIL-STD-750D)MIL MIL-STD-750D-1995半导体器件(取代MIL-STD-750C)MIL MIL-STD-701P-1992 标准半导体器件列表(...
DLA MIL-STD-750-1 CHANGE 2-2013相似标准 MIL MIL-STD-750-1B-2023半导体器件环境试验方法第1部分:试验方法1000至1999JB/T 8949.2-1999 电流大于100A普通整流管DLA MIL STD 750 2-2012测试方法半导体器件标准机械测试方法第2部分:2001年至2999年的测试方法DLA MIL-STD-750-2 CHANGE 3-2013测试方法半导体器件...