JEDECSTANDARDElectricallyErasableProgrammableROMEEPROMProgram/EraseEnduranceandDataRetentionStressTestJESD-A117ERevisionofJESD-A117DAugust018NOVEMBER018JEDECSolidStateTechnologyAssociationDownloadedbywangshengws3640@163.comonMay8006:4amPDTbyd
JEDEC JESD22-A117E：2018 Electrically Erasable Programmable ROM (EEPROM) Program Erase Endurance and Data Retention Stress Test（电可擦除可编程 ROM (EEPROM) 程序擦除耐久性和数据保留压力测试）JEDEC JESD22-A118B.01：2021 Accelerated Moisture Resistance - Unbiased HAST（加速的耐湿性-无偏的HAST）JEDE...
JEDEC JESD22-A117E:2018 Electrically Erasable Programmable ROM (EEPROM) Program Erase Endurance and Data Retention Stress Test(电可擦除可编程 ROM (EEPROM) 程序擦除耐久性和数据保留压力测试) JEDEC JESD22-A118B.01:2021 Accelerated Moisture Resistance - Unbiased HAST(加速的耐湿性-无偏的HAST) JEDEC...
JEDEC JESD22-A117E:2018 Electrically Erasable Programmable ROM (EEPROM) Program Erase Endurance and Data Retention Stress Test(电可擦除可编程 ROM (EEPROM) 程序擦除耐久性和数据保留压力测试) JEDEC JESD22-A118B.01:2021 Accelerated Moisture Resistance - Unbiased HAST(加速的耐湿性-无偏的HAST) JEDEC...
高加速温度和湿度应力测试（JEDEC JESD22-A110E.01）底部侧板连接能力评估（JEDEC JESD22-A111B）非封闭表面贴装器件的可靠性测试前预处理（JEDEC JESD22-A113I）电可擦除可编程ROM（EEPROM）的程序擦除耐久性和数据保留压力测试（JEDEC JESD22-A117E）加速的耐湿性-无偏HAST测试（JEDEC JESD22-A118...
Please refer to the DDR3 SDRAM data sheet (JESD79-3 or supplier data sheet) for a complete description of these options. Release 18 JEDEC Standard No. 21-C Page 4.1.2.11 – 19 Bit 7 Partial Array Self Refresh (PASR) 1 = Supported 0 = Not supported Bits 6 ~ 4 Reserved Bit 3 On...
今天,JEDEC正式宣布GDDR7为下一代显存标准,从公布的标准来看,JESD239 GDDR7的带宽是GDDR6的两倍(独立通道数量增加一倍,增加至4个),每个器件可达192 GB/s,支持16 Gbit至32 Gbit密度,包括支持双通道模式,使系统容量翻倍。 JEDEC表示:"JESD239 GDDR7标志着高速内存设计的重大进步。随着向PAM3信号的转变,存储器行业...
JEDEC Solid State Technology Association, the global leader in standards development for the microelectronics industry, today announced the publication of JESD405-1B JEDEC Memory Module Label - for Compute Express Link (CXL ) V1.1. JESD405-1B joins JESD317A JEDEC Memory Module Reference Base Stand...
本标准规定了基于资格规范进行有效的耐久性、保留性和跨温度测试的过程要求。电可擦除可编程只读存储器 (EEPROM) 程序 / 擦除 耐久性及数据保持应力测试, Electrically Erasable Programmable ROM (EEPROM) Program/Erase Endurance and Data
JESD22-A113I:2020 Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing - 可靠性测试前的非封闭表面贴装器件的预处理 JEDEC JESD22-A117E:2018 Electrically Erasable Programmable ROM (EEPROM) Program Erase Endurance and Data Retention Stress Test(电可擦除可编程 ROM (EEPROM)...