3. JEDEC JESD22-C101:这个标准规定了IC和元件对系统级模型(MM) ESD的测试方法和要求。 这些标准定义了ESD测试的条件、仪器设备和测试流程,以确保芯片能够在ESD事件下安全运行。每个标准针对不同的ESD电压模型,分别规定了不同的测试方法和测试参数。发送到邮箱 | +1 赞0 收藏 评论0 | 转发至: 关键...
JEDEC STANDARD DDR4 SDRAM JESD79-4 SEPTEMBER 2012 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION NOTICE JEDEC standards and publications contain material that has been prepared, reviewed, and approved through the JEDEC Board of Directors level and subsequently reviewed and approved by the JEDEC legal counsel...
JESD 74 EIA 365 JESD 6 JEP 123 JEP 134 JESD 82 JESD 12 JEP 79 JESD 8- 4 JESD 27 EIA 599-A JEP 114 JEP 137-A JESD 68 JESD 32 JESD 23 JESD 86 JEP 105 JESD 73-2 JESD 22-C101-A JESD 51- 4 MO 217-B JESD 1 JESD 11 JESD 2 JEP 112 JEP 101-C JEP 103-A 2002 Catalog ...
JEDEC Std JESD22-A114A (C1 = 100 pF, R1 = 1500 Ω, and R2 = 500 Ω). 2. Positive and negative pulses applied on different combinations of pin connections, according to AECQ100-002 (compliant with JEDEC Std JESD22-A114, C1 = 100 p...
HAST—JESD-A110—130℃,85%RH,Vccmax UHAST—JESD-A118—130℃,85%RH TCT—JESD-A104—-40℃~125℃，500cycles PCT—JESD-A102—121℃,100%RH,96hrs 1 Stress-Test-DrivenQualificationofIntegratedCircuits(JESD47H)•Preconditioningisrecommended,specificallyforwirebondedproductsqualifiedtoPbfreereflowprofiles....
JEDEC JESD51-14-2010单通道热流半导体器件结壳热阻瞬态双界面测试方法 AIA/NAS - Aerospace Industries Association of America Inc.,关于jedec51-14的标准 NAS1151-1158-1996Rev 14 (Rev. 14) NAS1081-2005Rev 14 (Rev. 14; FSC 5305) CZ-CSN,关于jedec51-14的标准 ...
PJESD6V8LC-5W,3KP58CA,1SMB3EZ17-AU,1.5SMCJ110A,1.5SMCJ110C,1SMB5938-AU,SX56F-AU,PJSD15CW-AU,BZX584B8V2,RS2AF,GDZJ30D,P6SMB16CA,3.0SMCJ70CA-AU,GDZJ30B,GDZJ30C,SVC12120V,P6SMBJ130CA,GDZJ30A,PJP10NA80,1.5SMCJ85CA,P4SMAJ130CA,1SMB3EZ6.2-AU,1.5SMCJ40A,1.5SMCJ40C,SS1060...