However, the measured results of the same cell in different positions are different because of uneven illumination, which may reduce the measurement accuracy and the diagnosis performance. Many methods are proposed to compensate for uneven illumination, but they are generally aimed at image enhancement...
The conical shape of the bundle of illuminating rays in the microscope causes a systematic error of transmittance measured with a microscope photometer in comparison with the (true) transmittance measured with a macrophotometer in which the ray bundle is cylindrical. The error is evaluated by the...
USB digital mini microscope 2.0MP 40X 240X zoom 8LED illumination patent design handheld microscope for measurement (1 review) Hangzhou Future Optics Sci & Tech Co., Ltd.15 yrsCN Previous slideNext slide Previous slideNext slideKey attributes Industry-specific attributes Warranty 3 years Theory ...
The illumination for a total reflection ion - fluorescence measurement has previously been carried out either by means of a prism on the side facing away from the microscope objective, wherein the sample to be examined is a complex manner on the prism has to be prepared. Alternatively, tirf ...
Then, the interaction of the evanescent wave with object structure having frequency kobj close enough to kg will give rise to a propagating wave of frequency |kobj−kg|<km. This frequency can be imaged by the microscope aperture. Clearly, such an imaging process would not be easy to carry...
imaging process. As a result, a sample’s fine structure (high-frequency component) cannot pass through the microscope system. However, a Moiré fringe with fine structure information but shifted to low frequency can be obtained, which can be used to resolve the fine structure of the specimen....
3D measurement of micromechanical devices vibration mode shapes with a stroboscopic interferometric microscope Microscopic interferometry is a powerful technique for the static and dynamic characterization of micromechanical devices. In this paper we emphasize its c... S Petitgrand,R Yahiaoui,K Danaie,.....
The axial resolution of three-dimensional structured illumination microscopy (3D SIM) is limited to ∼300 nm. Here we present two distinct, complementary methods to improve axial resolution in 3D SIM with minimal or no modification to the optical sy
31.A use of the illumination device according to claim 1 as an illumination in a microscope or in a head loupe magnifier or in a vision device or as vehicle lighting. Description: The present invention relates, first of all, to an illumination device according to the preamble of claim1. ...
Measurement of nanoparticle sizes by conventional optical microscopy with standing evanescent field illumination. The size of a particle smaller than the diffraction limit is measured using a conventional optical microscope by adopting a standing evanescent field illum... Xiang,Yu,Yukihiro,... - 《Optic...