ASTM D7214-07a利用峰面积积分用FT-IR测定已使用润滑剂中氧化物的标准试验方法 Standard Test Method for Determination of the Oxidation of Used Lubricants by FT-IR Using Peak Area Increase Calculation 被代替首页标准ASTM D7214-07aASTM D7214-07a 预览[下载] 引用关系 发布历史ASTM D7214-07a...
This multiple peak analysis is coupled, where necessary, with a Gaussian curve fitting and deconvolution procedure to distinguish between overlapping peaks. Typical experiments at elevated temperature and various inert conditions, nitrogen, dry and humid air, are described. Free radical and cationic ...
Peak Process Der ivatives... Subtraction... KK conversion... Y Unit Conversioni.^ Other. ► Co mimon Opt ion ► 對單一圖譜乘以係數所得結果為圖譜之縮放;加減一常數,所得結果為圖譜之平移。於預覽視窗中可隨意變更倍數或常數,上方為原始圖 譜,下方為結果圖譜 若進行兩個圖譜之四則運算,需先以重...
Weak anharmonicity effects were displayed. The role played by the host matrix and by temperature on the peak positions was examined and discussed.doi:10.1007/978-3-7091-6840-0_117Enrico BandiniPaola BeneventiDanilo BersaniRosanna CapellettiLászló Kovács...
The LO mode and the lower frequency shoulder peak of SiO2 on Si was detected by the FT-IR-ATR method, and this band was simulated by a gradient layered and effective medium model. Interface roughness estimated from the shoulder bands of ATR spectra was in good agreement with the GIXR ...
Standard Test Method for Determination of the Oxidation of Used Lubricants by FT-IR Using Peak Area Increase Calculation 被代替 预览ASTM D7214-07前三页 标准号 ASTM D7214-07 2007年 总页数 8页 发布单位 美国材料与试验协会 替代标准 ASTM D7214-07a ...
To avoid the effects of differences in optical paths due to oxide thickness, the dielectric function of the thick oxide was calculated and used to simulate the spectrum of a thin oxide film which had the dielectric function of the thick oxide and a TO phonon peak area nearly equal to that ...
SiFT-IRmeasurement"Peakheight"method.Due to ineffectiveness of routine IR-absorption method for determinahon of intershtial oxygen in heavilydoped silicon, a "peak-height' method has been dcveloped. The phosphorus-doped CZ-Si with n=(7.l~l2)脳1017cm-3 was taken as sample for ...
Fourier transform infra-red spectroscopy (FT-IR) studies detect a new peak at 801 cm1 upon electron beam irradiation, which is due to Si-C stretching in the case of modified dual phase fillers. The absence of the peak at 3400 cm1 and the presence of the peak at 1720 cm1 due to ...
The LO mode and the lower frequency shoulder peak of SiO 2 on Si was detected by the FT-IR-ATR method, and this band was simulated by a gradient layered and effective medium model. Interface roughness estimated from the shoulder bands of ATR spectra was in good agreement with the GIXR ...