The remaining faults包括:timing-independent(由于connection上的resistance越来越大)和non-single-stuck-at faults,non-feedback bridging faults. 相对来说,intra-clock-domain的fault容易检测,inter-clock-domain的delay fault testing比较复杂。 D必须设置的比较准确来detect inter-clock-domain faults 几种测试方法的比...
Transition delay和path delay 传统的stuck-at故障模型已不能充分覆盖这一类问题,因而新的delay故障模型应运而生。对delay故障模型求解的结果就是产生出所谓的at-speed测试向量。此类测试向量的应用对减少芯片DPM(Defect Per Million),提高产品良率有着非常明显的效果。本文...
Transition Delay VS Path Delay 传统的stuck-at故障模型已不能充分覆盖这一类问题,因而新的delay故障模型应运而生。对delay故障模型求解的结果就是产生出所谓的at-speed测试向量。此类测试向量的应用对减少芯片DPM(Defect Per Million),提高产品良率有着非常明显的效果。本文的重点不是介绍at-speed测试向量,而是通过对...
Transition Delay VS Path Delay 传统的stuck-at故障模型已不能充分覆盖这一类问题,因而新的delay故障模型应运而生。对delay故障模型求解的结果就是产生出所谓的at-speed测试向量。此类测试向量的应用对减少芯片DPM(Defect Per Million),提高产品良率有着非常明显的效果。本文的重点不是介绍at-speed测试向量,而是通过对...
网络全速测试 网络释义 1. 全速测试 ...够最大限度地把测试过程集成在芯片内部,同时支持芯片全速测试(At-Speed-Testing),已成为解决芯片测试难题和降低测试成本 … cdmd.cnki.com.cn|基于 1 个网页
At-speed Testing of SOC ICs Vlado Vorisek, Thomas Koch, Hermann Fischer Multimedia Design Center, Semiconductor Products Sector Motorola Munich, Germany Abstract This paper discusses the aspects and associated requirements of design and implementation of at-speed scan testing. It also demonstrates some ...
16.Construction of Thermodynamic Testing Experiment System Based on an Ice Thermal Storage Experimental Platform冰蓄冷实验平台构建的热工测试实验体系 17.Testing Laboratory Registration Council [TELARC] [New Zealand]测试实验所登记局﹝纽西兰﹞ 18.The results of the field survey and model test are coincide...
Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed in contrast to the localized nature of a traditional fault model. Due to parametric variations, different paths can be critical in different parts of the process space, and the...
These methods allow a short test pattern preparation time and the use of low-cost test equipment, while providing the high quality at-speed testing. 展开 关键词: automatic test pattern generation integrated circuit testing system-on-chip timing IC testing J750 tester SOC testing atspeed scan ...
1) at-speed testing 同频测试2) testing frequency 测试频率 1. After analyzing current fault diagnosis methods based on multi-frequency sensitivity in analog circuits,a new sensitivity matrix analysis approach is presented to select testing frequency. 在分析现有模拟电路多频灵敏度故障诊断方法的基础上...