At-speed testDesign-For-Test (DFT) techniques for acquiring fail bit map of at-speed function with conventional wafer test equipment are proposed. SRAM core is operated with high-frequency clock generated by gain-suppressed VCO which can reduce clock jitter. The data are outputted with data ...
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will se...
来源期刊 Acm Transactions on Design Automation of Electronic Systems 研究点推荐 Launch-On-Shift At-Speed Testing Peak Launch-to-Capture Power Reduction DFT Assisted Techniques launch-on-shift (LOS) testing design-for-testability (DFT) 站内活动 0...
Using timing constraints for generating at-speed test patterns: handling timing exception paths in ATPG tools while creating at-speed patterns has always b... It is well understood that at-speed testing is a requirement for modern electronic designs. The high clock speeds and small geometry sizes...
At-speed Testing of SOC ICs Vlado Vorisek, Thomas Koch, Hermann Fischer Multimedia Design Center, Semiconductor Products Sector Motorola Munich, Germany Abstract This paper discusses the aspects and associated requirements of design and implementation of at-speed scan testing. It also demonstrates some ...
Logic BIST通过将很多的tester functionality放在CUT中,减少了test costs,但是更重要的一方面是at-speed testing. At-speed test包括两部分: 1) intra-clock-domain fault:originates at one clock domain, terminate at the same clock domain 2) inter-clock-domain fault:originates at one clock domain, termina...
Integrated Fault-Tolerant Scheme for a DC Speed Drive 热度: 1 At-SpeedTransitionFaultTestingWithLowSpeedScanEnable NisarAhmed,C.P.Ravikumar ASICProductDevelopmentCenter TexasInstrumentsIndia Bangalore-560093 n-ahmed2,ravikumar@ti MohammadTehranipoor,JimPlusquellic ...
The non-scan DFT technique was applied to several data paths. Experimental results demonstrate the feasibility of producing non-scan testable data paths, which can be tested at-speed, with marginal area overheads 展开 关键词: VLSI VLSI ASIC designs area overheads at-speed testing data path ...
This paper attempts to quantify the economic benefits of including improved design for test (DFT) strategies into the ASIC design process. The qualitative ... R Gayle - IEEE International Test Conference on Designing 被引量: 48发表: 1993年 Clock controller for at-speed testing of scan circuits...
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