At-speed testDesign-For-Test (DFT) techniques for acquiring fail bit map of at-speed function with conventional wafer test equipment are proposed. SRAM core is operated with high-frequency clock generated by gain-suppressed VCO which can reduce clock jitter. The data are outputted with data ...
Margining Test with either internal or external loopback has become a popular Design for Test (DfT) feature in high-speed SerDes. These SerDes DfT-derived results are becoming more unreliable because SerDes devices are pushing the limits of process variability. In addition, implementing DfT at ...
DFT Assisted Techniques for Peak Launch-to-Capture Power Reduction during Launch-On-Shift At-Speed Testing 来自 ACM 喜欢 0 阅读量: 99 作者:S Potluri,AS Trinadh,SB Ch.,V Kamakoti,N Chandrachoodan 摘要: Scan-based testing is crucial to ensuring correct functioning of chips. In this scheme, ...
Using timing constraints for generating at-speed test patterns: handling timing exception paths in ATPG tools while creating at-speed patterns has always b... It is well understood that at-speed testing is a requirement for modern electronic designs. The high clock speeds and small geometry sizes...
This paper describes a low cost, high quality at-speed testing strategy implemented on a gigahertzmicroprocessor with multi-clock domains. Thepresented DFT method not only utilizes the internal phase-locked loops (PLLs) to provide complex test clock sequences, but also applies a hybrid scan compre...
At-speed Testing of SOC ICs Vlado Vorisek, Thomas Koch, Hermann Fischer Multimedia Design Center, Semiconductor Products Sector Motorola Munich, Germany Abstract This paper discusses the aspects and associated requirements of design and implementation of at-speed scan testing. It also demonstrates some ...
The non-scan DFT technique was applied to several data paths. Experimental results demonstrate the feasibility of producing non-scan testable data paths, which can be tested at-speed, with marginal area overheads 展开 关键词: VLSI VLSI ASIC designs area overheads at-speed testing data path ...
This paper attempts to quantify the economic benefits of including improved design for test (DFT) strategies into the ASIC design process. The qualitative ... R Gayle - IEEE International Test Conference on Designing 被引量: 48发表: 1993年 Clock controller for at-speed testing of scan circuits...
Logic BIST通过将很多的tester functionality放在CUT中,减少了test costs,但是更重要的一方面是at-speed testing. At-speed test包括两部分: 1) intra-clock-domain fault:originates at one clock domain, terminate at the same clock domain 2) inter-clock-domain fault:originates at one clock domain, termina...
一种常见的 at-speed 测试向量时序如图 2 所示。launch-off-shift 测试利用 shift 的最后一个时钟沿进 行触发。其优点处理时测试向量的生成比较简单,容易达到更高的测试覆盖率。缺点是在进行 DFT 处理时 必须把 SE 信号作为关键时间信号进行布局布线处理,同时会由于 SE 不能够及时拉低带来过紧的路径延迟 约束而...