Retracted: XRD Peak Profile Analysis of SiC Reinforced Al 2 O 3 Ceramic Composite Synthesized by Electrical Resistance Heating and Microwave Sintering: A ComparisonMICROWAVE heatingRESISTANCE heatingMICROWAVE sinteringX-ray diffractionRESEARCH integritydoi:10.1155/2023/9795810...
The analysis of the XRD kinetic profiles was performed using the Gualtieri model (Eq. 1)43, which enables deconvoluting the nucleation and growth processes. According to the fitted data, the increase of the synthesis temperature affects both the rates of nucleation and crystal growth. The values...
The RuAl{211} peak was chosen (being isolated and relatively high in angle). The final XRD patterns obtained at room temperature served as reference to calibrate the 2θ zero shift. The maximal error due to macrostrains is determined to be 72 °C under the assumption of a biaxial ...
The cross-sectional XRD patterns of the LPBF-fabricated Scalmalloy together with the reference peak position of pure Al (JCPDS Card No. 01-073-2661) are shown in Fig. 6(a). The enlarged figure of the peaks at 2θ = 38.3° and 44.6° shows that each peak is divided into two peaks,...
athe diffraction peak position is identical with XRD standard diffraction card of γ-Al2O3. 衍射峰顶位置是完全相同和γ氧化铝XRD标准衍射卡片。[translate]
Fig. 5. XRD patterns of the studied formations. (a) Scoriaceous facies (NGP1 and NGP3), (b) Nodular facies (NGS2 and NGS3), (c) Massive facies (NGM3 and NGP2), (d) pisolithic facies (NGP1 and NGP4), (e) Conglomeratic facies (DIR1 and DIR2), (f) Vacuolar facies (DIR...
供给我一切动力那里将继续是[te),至于为我世界您必须保护。 [translate] a与γ-Al2O3的XRD标准衍射卡对照,衍射峰位置完全相同。 With γ-Al the 2O3 XRD standard diffraction card comparison, the diffraction peak position is completely same. [translate] ...
The possible reasons for the shift in the peak position are due to the quantum size effects and internal stress in the ultrathin Al films. 展开 关键词: Ultrathin Al films DC magnetron sputtering Morphology Optical properties DOI: 10.1016/j.vacuum.2009.11.002 被引量: 10 ...
The shape and peak position of the XRD patterns showed that the pulsed electromagnetic field treatment changed the microstructure and several properties of the solidified alloy. The crystal structures of the Al–Zn–Mg–Cu alloy ingot cores were analyzed using a D8 ADVANCE XRD diffractometer. The ...
The main (101) peak position in the Al-doped samples was observed to shift slightly to larger angles compared to that in pure ZnO NPs (inset of Fig. 2). This shift was about 0.02° for the Al-doped ZnO NPs synthesized by FSP. It is attributed to the reduction in the interlayer ...