必应词典为您提供wafer-burn-in的释义,网络释义: 晶圆老化;晶圆老化测试;
电压电流（DCTEST）测试是指在设计和装配过程中筛选不良产品的过程，而老化测试（Burn-inTEST）是指在施加极端条件后进行测试，以提前检查可能存在不良产品的过程。只有通过这一过程，半导体芯片所在的电子设备才能获得无错误运行的可靠性。2) Main Test 通过DC &Test Burn in测试的产品将在室温和低温空间中进行电气特...
Proven applications include: Full wafer functional, stress, and burn-in test of automotive ICs; low cost full wafer test of discrete or embedded memories; Learn more about Single Wafer Test and Burn-in Solutions. Multi Wafer Test and Burn-in Solutions The FOX-XP is a Multi-Wafer System burn...
PROBLEM TO BE SOLVED: To protect an external electrode of a wiring board from damages caused by a pogo pin on a drawing-out board like a performance board, even if the wiring board for holding a probe card is swelled by heat during wafer burn-in.NAKADA YOSHIRO...
a wafer burn-in test priority decision circuit configured to output test priority signals according to output signals of the shift registers, and a decoder configured to decode the output signals of the shift registers according to the priority signals and configured to output wafer burn-in test ...
A wafer burn-in test and a wafer test circuit for a semiconductor memory device which can cut down packaging expenses and improve F/T yield by performing a wafer burn-in test by using a pad for contact in a probe test of a wafer state. HM Sung 被引量: 9发表: 2004年 Wafer burn-in...
Wafer burn-in cassette and method of manufacturing 优质文献 相似文献 参考文献 引证文献Probe apparatus and burn-in apparatus A loader section for supplying semiconductor wafers is arranged at one end of a linear first convey path for a convey unit. Burn-in test sections, probe test sections, a...
operation of the sub word line driver, wherein a ground power source is applied to the first and second power lines during a normal operation, and the ground power source and a step-up power source are alternately applied to the first and second power lines during a wafer burn-in test ...
operation of the sub word line driver, wherein a ground power source is applied to the first and second power lines during a normal operation, and the ground power source and a step-up power source are alternately applied to the first and second power lines during a wafer burn-in test ...
WAFER BURN-IN TEST METHOD, WAFER BURN-IN TEST APPARATUS, AND SEMICONDUCTOR STORAGE DEVICE 来自 百度文库 喜欢 0 阅读量: 33 申请(专利)号: JP20050353523 申请日期: 2005-12-07 公开/公告号: JP2007157282A 公开/公告日期: 2007-06-21 申请(专利权)人: ELPIDA MEMORY INC 发明人:...