必应词典为您提供wafer-burn-in的释义,网络释义: 晶圆老化;晶圆老化测试;
EPM(电气参数监测)是Electrical Parameter Monitoring的缩写，是通过测试半导体直接电路(IC)运动所需的各个元件的电气直流电压、电流特性的参数来确定其工作是否良好的过程。WFBI(老化测试）是Wafer Burn In的缩写，是对晶片施加一定温度的热量，然后施加AC/DC电压，找出潜在产品缺陷的过程。通过这两个步骤可以提高有效提高...
Proven applications include: Full wafer functional, stress, and burn-in test of automotive ICs; low cost full wafer test of discrete or embedded memories; Learn more about Single Wafer Test and Burn-in Solutions. Multi Wafer Test and Burn-in Solutions The FOX-XP is a Multi-Wafer System burn...
PROBLEM TO BE SOLVED: To provide a relatively inexpensive wafer burn-in system that can be press-contacted evenly with all terminals, even if the number of the terminals with which the system is brought into contact in batch, in a state of a wafer increases.OOTA HIRONORI...
A wafer burn-in test mode circuit includes a command decoder, an address latch circuit configured to latch an address signals, a register configured to store a wafer burn-in address signal from the address latch, a wafer burn-in test mode entry circuit configured to generate a wafer burn-in...
operation of the sub word line driver, wherein a ground power source is applied to the first and second power lines during a normal operation, and the ground power source and a step-up power source are alternately applied to the first and second power lines during a wafer burn-in test ...
operation of the sub word line driver, wherein a ground power source is applied to the first and second power lines during a normal operation, and the ground power source and a step-up power source are alternately applied to the first and second power lines during a wafer burn-in test ...
The present invention provides a burn-in test circuit for detecting a defective cell of a semiconductor memory device having a plurality of memory cells, a word line connected to each of the memory cells, and a row decoder for selecting the word line, A word line driver connected to the wo...
Wafer burn-in cassette and method of manufacturing 优质文献 相似文献 参考文献 引证文献Probe apparatus and burn-in apparatus A loader section for supplying semiconductor wafers is arranged at one end of a linear first convey path for a convey unit. Burn-in test sections, probe test sections, a...
Semiconductor memory device and method of wafer burn-in test for the same A semiconductor memory device comprising a memory cell array with a plurality of word lines, first and second dummy word lines, and a dummy word line driver suitable for separately driving the first and second dummy word...