XPS spectra of (b) O 1s, (c) S 2p and (d) N 1s of the CEI layer formed after cycling under 4.2 V. (e) TEM image, XPS spectra of (f) O 1S, (g) S 2p and (
g)在钛网电极上Vn-RuO2在10 mA cm-2下的计时电位曲线，与c -RuO2相比，Vn-RuO2具有显著的稳定性。h) Vn-RuO2的稳定性与先前报道的贵金属基电催化剂的稳定性比较。Operando Ru K-edge XAS光谱，ATR-SEIRAS FTIR光谱和dem研究。a)OCV至1.7 V vs RHE下，operando Ru K-edge XANESspectra的3D图。b) R...
The distribution of vanadium oxidation states in a 5.9 wt% V/AlOcatalyst reduced in Hor CO was determined from XPS V 2pspectra. Principal component analysis (PCA) was used to statistically determine the number of components (oxidation states) that describe the V 2penvelope of the reduced V/...
Fig. 2d shows the V 2p XPS spectra of V-400 and V-600. Two peaks in V-400 have a slightly negative shift of 0.1 eV compared with the V-600. The result shows the existence of electron interaction between cations, confirming the effect of vanadium vacancy on the material’s ...
Fig 7.a,b) Electrochemical impedance spectroscopy of a) PVDF-LCO and b) DSL-LCO after 200 cycles at 1C. c,d) X-ray photoelectron spectroscopy (XPS) of c) C 1s and O 1s XPS spectra of PVDF-LCO and DSL-LCO cathodes after 2...
SNCM particles. (d) HAADF-STEM image and corresponding SEAD patterns of AN-SNCM. (e-g) TEM of AN-SNCM particle surface. (h) HADDF image of AN-SNCM and TEM-EDS element mapping results of Ni, Al, Nb. (i-j) XPS patterns with a different etching time of Al 2p, Nb 3d for AN-...
and AN-SNCM particles. (d)HAADF-STEMimage and corresponding SEAD patterns of AN-SNCM. (e-g) TEM of AN-SNCM particle surface. (h) HADDF image of AN-SNCM andTEM-EDSelement mapping results of Ni, Al, Nb. (i-j)XPSpatterns with a different etching time of Al 2p, Nb 3d for AN-SNCM...
SNCM particles. (d) HAADF-STEM image and corresponding SEAD patterns of AN-SNCM. (e-g) TEM of AN-SNCM particle surface. (h) HADDF image of AN-SNCM and TEM-EDS element mapping results of Ni, Al, Nb. (i-j) XPS patterns with a different etching time of Al 2p, Nb 3d for AN-...
Experimental/ binding energy vanadium compounds X-ray photoelectron spectra/ V 2O 5 V 6O 13 VO 2 V 2O 3 surface characterisation FWHM V 2p 3/2 XPS peak O 1s XPS peak shape binding energy sample treatments adventitious C X-ray beam crystalline V 2O 5 polycrystalline V 2O 5 ...
Chemical state X-ray photoelectron spectroscopic analysis of first row transition metals and their oxides and hydroxides is challenging due to the complexity of the 2p spectra resulting from peak asymmetries, complex multiplet splitting, shake-up and plasmon loss structure, and uncertain, overlapping bin...