The TPG methods are implemented by the LFSR (Linear feedback shift Register) based methods for the Built in Self Test (BIST) which will reduce the complexity of VLSI Testing. A major consideration factor of these architectures is that the pseudo random patterns generated by the LFSR lead to ...
Crosstalk Avoidance CodesForbidden Transition FreeEncodingSystem on ChipParasiticCoupling CapacitanceDeep-submicronIJCSIRecently, reducing crosstalk noise delay is an important issue in VLSI design. As circuit geometries become smaller, wire interconnections become closer together and taller, thus increasing the...
Launch-off-shift (LOS) method provides higher fault coverage and lower pattern count when compared to launch-off-capture (LOC) method. Investigations have proven that some faults can be detected using LOC but not LOS and vice-versa. In LOS, the second pa
Broadside tests are two-pattern scan-based tests for delay faults. One of the complications that occur in relation to the application of broadside tests fr... I Pomeranz,SM Reddy - IEEE International Symposium on Defect & Fault Tolerance in Vlsi Systems 被引量: 13发表: 2009年 Adopting the ...
In: Proceedings of international test conference, p 705 Savir J, Patil S (1994) On broad-side delay test. Very Large Scale Integration (VLSI) Systems 2, 368 Saxena J, Butler KM, Gatt J, Raghuraman R, Kumar SP, Basu S, Campbell DJ, Berech J (2002) Scan-based transition fault ...
- IEEE Vlsi Test Symposium 被引量: 28发表: 2005年 Methods for determining the depth of defects A method facilitates inspection of a component surface. The method comprises positioning a surface of the component to be inspected in an optical path of at least one infrared radiation detector, ...
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[5].Thetransitionfaultandpathdelayfaulttestingtogetherpro-videarelativelygoodcoveragefordelay-induceddefects[6][7].Pathdelaymodeltargetsthecumulativedelaythroughtheentirelistofgatesinapre-definedpathwhilethetransitionfaultmodeltargetseachgateoutputinthedesignforaslow-to-riseandslow-to-falldelayfault[8].Scan...
Yi, et al., “Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains”, ETRI Journal, vol. 30, No. 3, Jun. 2008, pp. 403-411. Lewis, et al., “Testing Circuit-Partitioned 3D IC Designs”, In IEEE Computer Society Annual Symposium on VLSI, Tampa, FL, May 20...
al., “Evaluation of the Raw Microprocessor: An Exposed-Wire-Delay Architecture for ILP and Streams,” Proceedings of International Symposium on Computer Architecture, Jun. 2004. Taylor, Michael Bedford et. al., “Scalar Operand Networks: On-Chip Interconnect for ILP in Partitioned Architectures,...