2.Based on the analysis and research on FAN algorithm, an IDDT test pattern generation algorithm for stuck-open faults is p.本文采用启发式搜索的方法,基于对FAN算法的分析,在不考虑冒险的情况下对于CMOS电路中的开路故障,探讨了利用FAN算法进行瞬态电流测试生成的可能性。 英文短句/例句 1.REPAIR THE OPEN...
This paper proposes a stuck-open test generation system which generates test patterns with high fault coverage for single stuck-open faults in CMOS combinational circuits. In the proposed method, although the stuck-open faults are treated at switch level in each cell consisting of CMOS logic gates...
Testability of stuck-open faults in CMOS implementation of the Reed鈥揗uller canonical (RMC) form of a switching function is considered in this paper. It is shown that a slightly modified RMC expression can be used to synthesize an easily testable combinational logic circuit. The design admits ...
On testing stuck-open faults in CMOS combinational circuits Recently it has been found that a class of failure related to a particular technology (CMOS) cannot be modelled as the conventional stuck-at fault model. T... R Chandramouli - IN: Annual Allerton Conference on Communication, Control,...
Robust test has been proposed to overcome the potential invalidation of the two-patten test due to hazards. However, it is difficult to generate robust test patterns and they may not exist for some stuck-open faults. In this paper, to overcome this difficulty, we propose a new testable desig...
A design method for a 2-rail logic combinational circuit is proposed, where stuck-open and stuck-on faults in FETs can be easily detected. In the proposed circuit design, 4 FETs are added to each gate in a conventional 2-rail logic circuit. Two logical gates, OR and AND, are also adde...
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This paper proposes a stuck-open test generation system which generates test patterns with high fault coverage for single stuck-open faults in CMOS combinational circuits. In the proposed method, although the stuck-open faults are treated at switch level in each cell consisting of CMOS logic gates...
Rowland, 'Self-Test Pattern to Detect Stuck-Open Faults', US Patent No.: US 6,442,085 B1, Aug. 27, 2002M.T. Fragano, J.H. Oppold, M.R. Ouellette and J.P. Rowland, "Self-Test Pattern to Detect Stuck-Open Faults", US Patent No.: US 6,442,085 B1, Aug. 27, 2002...
Considers testability criteria for stuck-open faults in one-dimensional, unilateral, iterative circuits of CMOS combinational cells, and gives necessary and sufficient conditions for the testability of such faults. These conditions are extended to include stuck-open C-testability of the circuit. The ...