Fan X, Moore W, Hora C, Gronthoud G (2005) Stuck- open fault diagnosis with stuck-at model. In: Proceedings European test symposium, Tallin, pp 182-187X. Fan, W. Moore, C. Hora, and G. Gronthoud, "Stuck-Open Fault Diagnosis with Stuck-at Model" in IEEE European Test Symposium,...
While most of the fault diagnosis tools are based on gate level fault models, many faults are actually at the transistor level. The stuck-open fault is one of them. In this paper we introduce a stuck-open fault diagnosis method based on the stuck-at fault model. First we investigate how...
I'm very confident that would work. But I haven't tested and won't, sorry. This made me lose too many hours already (though mainly company policy's fault) that my bossman won't be happy to hear about. Sorry, something went wrong. ...
Check technical service bulletins (TSB) for the particular symptoms, stored code/s, and vehicle make and model before beginning your diagnosis. If a related TSB is located, the information therein may help you in diagnosing the P2004 in your vehicle. I like to start my diagnosis with a visu...
Testing by targeting only stuck-at or bridging faults is no longer sufficient. Yet, increasing defect coverage is even more important. A stuck-open fault model considers transistor level defects, many of which are not covered by a stuck-at fault model. Further, test vectors for stuck-open ...
For a gate level fault model of stuck-open faults in CMOS circuits, SR(slow-rise) and SF(slow-fall) gate transition faults we develop a neural network representation. A neural network computation technique for generating robust test patterns for stuck-open faults is given. The main result is...
The results of this paper are extended in the following sense: It is shown that 15 log( n) — 13 test patterns suffice to exhaustively test the multiplier with respect to the "extended cellular fault model", which includes single stuck-at and single stuck-open faults. Finally the main ...
stuck-open fault diagnosistransistor level circuit descriptionWhile most of the fault diagnosis tools are based on gate level fault models, for instance the stuck-at model, many faults are actually at the transistor level. The stuck-open fault is one example. In this paper we introduce a ...