必应词典为您提供Stuck-open-Fault的释义,网络释义: 固定开路障碍;开路故障;
1)stuck-open fault开路故障 1.This paper explores the feasibility for transient current test (I DDT)generation for stuck-open fault in CMOS circuits assumed that hazards are not considered in the circuits.在不考虑冒险的情况下 ,对于CMOS电路中的开路故障 ,探讨了利用FAN算法进行瞬态电流测试产生的可能...
This paper proposes a stuck-open test generation system which generates test patterns with high fault coverage for single stuck-open faults in CMOS combinational circuits. In the proposed method, although the stuck-open faults are treated at switch level in each cell consisting of CMOS logic gates...
stuck-open faultReed-Muller canonicalCMOS circuitTestability of stuck-open faults in CMOS implementation of the ReedMuller canonical (RMC) form of a switching function is considered in this paper. It is shown that a slightly modified RMC expression can be used to synthesize an easily testable ...
The stuck-open fault is one of them. In this paper we introduce a stuck-open fault diagnosis method based on the stuck-at fault model. First we investigate how stuck-open faults show in the stuck-at diagnosis. Based on the stuck-at diagnosis result, a transformation method is used to ...
Open three-phase inverter bridge IGBT inverter fault diagnosis, below the three-phase IGBT inverter bridge fault diagnosis technology. 它解决了采用Park矢量法判断逆变桥IGBT的开路故障,在突加负载或突减负载时造成的误诊断的问题. It solves the adoption Park vector method to determine the IGBT inverter ...
[IEEE Proceedings. IEEE Energy and Information Technologies in the Southeast\" - Columbia, SC, USA (9-12 April 1989)] Proceedings. IEEE Energy and Information Technologies in the Southeast\" - A CMOS stuck-open fault simulator 来自 IEEEXplore 喜欢 0 阅读量: 8 作者:...
1) stuck-open fault 开路故障 1. This paper explores the feasibility for transient current test (I DDT)generation forstuck-open faultin CMOS circuits assumed that hazards are not considered in the circuits. 在不考虑冒险的情况下 ,对于CMOS电路中的开路故障,探讨了利用FAN算法进行瞬态电流测试产生的可能...
Tower Bridge is seen stuck in the open position, due to a technical fault, in London, Britain, August 9, 2021. REUTERS/Henry Nicholls LONDON (Reuters) - London's famous Tower Bridge got stuck in its open position for the second time in a year due to a technical fault on ...
A novel scan-based Built-In Self-Test (BIST) architecture is designed with Low-Power (LP) for weighted pseudorandom test pattern generation (WPTPG) and reseedindoi:10.2139/ssrn.3125993Chitra, AVijay Murugan, SSathiyabhama, BSocial Science Electronic Publishing...