Since its inception, the pseudo-stuck-at fault model has demonstrated its usefulness in generating IDDQ patterns, calculating coverage, and diagnosing defects. However, the model's definition has lacked rigor, which has resulted in multiple, incompatible, interpretations. This paper provides a complete...
中文伪Stuck-At(错误) 英语 翻译Pseudo Stuck-At (Fault) PSA缩写是伪Stuck-At(错误)的意思,PSA全写Pseudo Stuck-At (Fault)。 PSA缩写可能还有其它意思,请根据自身行业、属性核对选择PSA正确的英文缩写及全写。 参考资料: 1.百度翻译:伪Stuck-At(错误) 2.有道翻译:伪Stuck-At(错误)...
before they go back to their family clean and begin fresh, but something goes wrong that prolongs their assignment and sees a no exit for all friends as they are stuck with where they got themselves into, with a big twist and shocker which is not predicted at all when you watch the ...
Next, we show that the same conclusion can be drawn when stuck-at or bridging fault coverage is targeted rather delay fault coverage. A modified hardware TPG structure allowing the generation of truly random test patterns is introduced at the end of the paper 展开 关键词: BIST Delay Testing ...
The increasing fault in the manufacturing process of solid-state circuits is a big problem. R... LG Hou,WU Wu-Chen - 《China Integrated Circuit》 被引量: 0发表: 2008年 A comparative study of pseudo stuck-at and leakage fault model Circuit simulationtests. We show that pseudo stuck-at ...
From this information, which defines a model of the stuck-at faults in terms of spectral coefficients, the test patterns may be selected even when the exact effect of each fault on the Reed-Muller spectrum of the function is not fully known. As a result, a test-generator algorithm has ...
In this paper, we have developed a test (Markov) model which faithfully reflects the pseudorandom behavior of test patterns, and all detectable single stuck-at faults (instead of the worst single stuck-fault only) are considered. The required test length is then determined by solving ...
However, fault coverage is much higher?all irredundant multiple as well as single stuck faults are detected. The test patterns are easily generated algorithmically either by program or hardware.关键词: Autonomous test built-in self-test pseudoexhaustive test test pattern generation test pattern ...