The trade-off between our power-driven scan-cell reordering and a routing-driven scan-cell reordering is discussed based on experiments as well. 展开 关键词: correlation scan-chain reordering signal transitions 会议名称: IEEE Vlsi Test Symposium ...
A method for reordering a scan chain so that the given constraints are met and the peak power dissipation is minimized and disclosed. The constraints include a maximum peak power dissipation, a maximum scan chain length and a maximum distance between two successive registers. The developed tool ...
Scan chain reordering is widely used method to reduce test power. In this paper, a Hamming distance based distributed reordering for loading and unloading scan chain vector is proposed. This method focuses on how and where weighted transitions occur. In current scenario of VLSI the manufacturing ...
In Very Large Scale Integrated Circuits (VLSI) design, the existing Design-for-Test(DFT) based watermarking techniques usually insert watermark through reordering scan cells, which causes large resource overhead, low security and coverage rate of watermark detection. A novel scheme was proposed to ...
22. W. Li, S. Wang, S. T. Chakradhar and S. M. Reddy, “Distance restricted scan chain reordering to enhance delay fault coverage,” in Proc. Int. Conf. on VLSI Design, pp. 471-478, 2005. Google Scholar 23. P. Gupta, A. B. Kahng, I. Mandoiu, P. Sharma, “Layout-aware ...
Our flow is basically the same as the traditional scan reordering flow but is driven by global routing or even trial detailed routing; our contribution lies in showing its prac- ticality as well as its surprisingly large reductions in scan overhead. 4 Experiments and Results In this section ...
Scan Chain Reordering: In Ref. [66], the order of scan cells is dynamically reconfigured by an unpredictable scrambler, which increases the routing overhead significantly. In Ref. [67], each scan chain is divided into several segments, and then the test controller determines the segments' scan...
To reduce the test data volume and test application time, the problem addressed here is minimizing the number of conflicting bits by optimally reordering test vectors. Each vector represents a city, and the number of conflicting bits between two test vectors is regarded as the distance between ...
Several techniques have been proposed to address the power issues that result from excessive switching activity. Some have tackled the problem during the generation of the test vectors through modification of the ATPG algorithm. Others have proposed a reordering of the scan cells and data vectors ba...
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