内容提示: INCH–POUND AMSC N/A FSC 5961 MIL−STD−750F w/CHANGE 3 1 April 2021 SUPERSEDING MIL−STD−750F w/CHANGE 2 30 November 2016 DEPARTMENT OF DEFENSE TEST METHOD STANDARD TEST METHODS FOR SEMICONDUCTOR DEVICES The documentation and process conversion measures necessary to comply ...
MIL–STD–750–3 3January2012 SUPERSEDING MIL–STD–750E(INPART) 20November2006 (see6.4) DEPARTMENTOFDEFENSE TESTMETHODSTANDARD TRANSISTORELECTRICALTESTMETHODSFORSEMICONDUCTORDEVICES PART3:TESTMETHODS3000THROUGH3999 AMSCN/AFSC5961 Thedocumentationandprocess conversionmeasurednecessary tocomplywiththisrevisionshal...
DLA MIL-STD-750F w/CHANGE 3-2021的标准全文信息,本试验方法标准旨在为半导体设备提供统一的测试方法,以检测其环境、物理和电气特性。半导体器件试验方法, Test Methods for Semiconductor Devices, TEST METHODS FOR SEMICONDUCTO