A110-B 高加速温度湿度压力测验的测试方法 Test Method A110-B Highly-Accelerated Temperature and Humidity Stress Test (HAST) 作废 JEDEC JESD22-A110-B-1999 发布历史JEDEC JESD22-A110-B-1999 标准号 JEDEC JESD22-A110-B-1999 1999年 总页数
EIA /JESD22-B107-A:(Marking Permanency)标记永久性 JESD22-B108A:(Coplanarity Test for Surface-Mount Semiconductor Devices)表面贴装半导体器件的共面性试验 JESD22-B109:(Flip Chip Tensile Pull)倒装芯片拉力 JESD22-B110:(Subassembly Mechanical Shock)组件机械冲击 JESD22-B111:(Board Level Drop Test Met...
JEDEC 100系列标准
JEDEC JESD22-A110D-2010相似标准IEC PAS 62177:2000 高加速温度和湿度应力试验(HAST) PAS 62177-2000 高加速温度和湿度压力测试(HAST)(1.0 版) GB/T 4937.4-2012 半导体器件.机械和气候试验方法.第4部分:强加速稳态湿热试验(HAST) GB/T 34986-2017 产品加速试验方法 GB/T 4937.26-2023 半导体器件 机械和...
J EDEC STANDARD Highly Accelerated Temperature and Humidity Stress Test (HAST) JESD22-A110E (Revision of JESD22-A110D, November 2010) JULY 2015 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION Solid State Technology AssociationProvided by IHS under license with JEDEC Licensee=Chongqing Institute of quality and...
(%) THB JESD22-A101-B (85ºC / 85% RH) (N =2.66, Ea = 0.79 eV) HAST JESD22-A110-B (130ºC / 85% RH) (N =2.66, Ea = 0.79 eV) Desk Top Computer with Enrgy Saving Features Main: Mini Short: Shutdown: Package Saturation Total Stress Time: 40ºC / 65% 56ºC / ...
QUALIFICATION RESULTS SUMMARY OF FAB TRANSFER AT ADI PER PCN 17_0142 TEST SPECIFICATION SAMPLE SIZE RESULTS High Temperature Operating Life (HTOL)* JEDEC JESD22-A108 1*77 Passed Highly Accelerated Stress Test (HAST)* JEDEC JESD22-A110 1*77 Passed Autoclave JEDEC JESD22-A102 1*77 Passed ...
JESD22-A110- HIGHLY ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST (HAST) This document defines a standard method for performing HAST, which evaluates the reliability of non-hermetically packaged solid state devices exposed to humid environments, particularly their resistance to internal corrosion. It ...
THB—JESD-A101—85℃,85%RH,Vccmax HAST—JESD-A110—130℃,85%RH,Vccmax UHAST—JESD-A118—130℃,85%RH TCT—JESD-A104—-40℃~125℃，500cycles PCT—JESD-A102—121℃,100%RH,96hrs 1 Stress-Test-DrivenQualificationofIntegratedCircuits(JESD47H)•Preconditioningisrecommended,specificallyforwire...
1.AEC-Q100 偏压高加速应力试验Biased HAST (HAST) 1.1 测试信息 样品数量:每批77颗,3批次;共231颗待测芯片(已经过预处理试验) 参考方法:JEDEC JESD22-A110 电源要求:设置电压偏置 测试温度:+130℃ 测试湿度:85% RH 测试时间:96小时 测试确认:芯片功能/性能测试(试验前后在室温和高温下电测) 合格判据:所有...