The crystallinity of the BTO films on PSO substrates was inferred from four-circle X-ray diffraction (XRD) measurements with a Cu Kα1 source (Supplementary Fig. 4). From reciprocal space maps of the BTO film around the PSO (332¯)O and PSO (240)O reflections, we concluded that the ...
Sharp (110) and (220) peaks appeared in the XRD pattern. The surface morphologies observed by SEM are similar to the typical computer generated grain arrangements obtained by Suzuki et al. in their micromagnetics study. Furthermore, a particular kind of structure of film cross-section was ...
Similar phenomenon of the periodically changed Raman peak intensity has never been observed on BaM films with their c-axis randomly dis- tributed in the film plane, even though the XRD patterns also show strong in-plane oriented peak intensities. This part of work will be soon reported. Raman...
Diffraction-plane-transformation modelXRD patternBS-PT piezoelectric ceramicThe domain structure ofBiScO-PbTiOpiezoelectric ceramic is investigated from the view of different electrical poling. The X-ray-diffraction (XRD) approach is used to acquire relative intensity ratio of domain reflections, thus the...
Note that the 110 peak—corresponding to an interplanar distance of 4.7 Å—appears in the XRD pattern around 19° (inset in Fig. 1e). This peak does not exist in the ternary 211 phases. This superstructure peak thus occurs solely due to Mo/Sc chemical ordering and is potentially quite...
We presume, according to the coherence between 2θand the lattice space, that the shoulder peaks can be attributed to a Cs-rich phase caused by Cs incorporation15,18,19. Considering the conventional X-ray diffraction (XRD) results (Supplementary Figs.7and8), we may conclude that the spatiall...