Sharp (110) and (220) peaks appeared in the XRD pattern. The surface morphologies observed by SEM are similar to the typical computer generated grain arrangements obtained by Suzuki et al. in their micromagnetics study. Furthermore, a particular kind of structure of film cross-section was ...
The crystallinity of the BTO films on PSO substrates was inferred from four-circle X-ray diffraction (XRD) measurements with a Cu Kα1 source (Supplementary Fig. 4). From reciprocal space maps of the BTO film around the PSO (332¯)O and PSO (240)O reflections, we concluded that the ...
Note that the 110 peak—corresponding to an interplanar distance of 4.7 Å—appears in the XRD pattern around 19° (inset in Fig. 1e). This peak does not exist in the ternary 211 phases. This superstructure peak thus occurs solely due to Mo/Sc chemical ordering and is potentially quite...
we investigated the crystalline structure of the films using XRD (Bruker-AXS, D8 Discover; Bruker). Based on the diffraction patterns obtained for all film samples, strong sharp peaks were derived from (001) to (007) from thec-axis crystal orientation. On the other ...
Diffraction-plane-transformation modelXRD patternBS-PT piezoelectric ceramicThe domain structure ofBiScO-PbTiOpiezoelectric ceramic is investigated from the view of different electrical poling. The X-ray-diffraction (XRD) approach is used to acquire relative intensity ratio of domain reflections, thus the...
SiO2are indeed few-layered, whereas those in MoS2-NPs are multilayered. On the contrary, XRD patterns of commercial MoS2and MoS2-HT (Supplementary Fig.17) exhibit significantly greater intensity in the (002) reflection compared to other peaks, signifying a high degree of stacking for the MoS2...
(Supplementary Table 2). Note that the 110 peak—corresponding to an interplanar distance of 4.7 Å—appears in the XRD pattern around 19° (inset inFig. 1e). This peak does not exist in the ternary 211 phases. This superstructure peak thus occurs solely due to Mo/Sc chemical ...
We presume, according to the coherence between 2θand the lattice space, that the shoulder peaks can be attributed to a Cs-rich phase caused by Cs incorporation15,18,19. Considering the conventional X-ray diffraction (XRD) results (Supplementary Figs.7and8), we may conclude that the spatiall...
The behavior of the specimens was defined in terms of lateral strength, ductility, displacement capacity, deformation of the joint reinforcement and crack pattern. The results indicate that joint reinforcement increases the strength of the system; however, the increase was more pronounced in longer ...