The in-plane XRD technique with a grazing incident x-ray beam has been used successfully to enhance the thin-film intensities and to minimize the substrate intensities in the analysis a thin-film(1).Three-dimen
In-plane XRD measurements - Rigaku在平面XRD测量-理学.pdf阅读:781次|页数:9页|上传:2013-12-09 20:23 相关文档 计算机知识windows系统:开始--运行--命令大全0421050529第一期 女孩要富养--杨澜269 SketchUp在小型建筑设计中的应用研究---优秀毕业论文参考文献可复制黏贴 AutodeskREVIT培训教程-03 安妮老师--...
The in-plane XRD measurements of the hybrid LB film gave one diffraction peak at 20.0° (0.44 nm), which we assigned to the (1 1 0) and (0 2 0) reflections of montmorillonite. This was the first example of the in-plane diffraction from a single layered montmorillonite, ...
out-of-plane指的就是晶格ab面外的xrd图像，这是用于检测多层膜三明治结构的物质
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寻求有机薄膜的In plane（面内）模式XRD测试？你可以申请上海同步辐射光源实验室BL14B1，...
useful for designing new Results Evolution of crystal structure parameters. We performed powder synchrotron XRD and Rietveld refinement analysis files for x = 0.6 and yfo =r 0C.5e1a−rxeNddixsOpl0a.5yFe0d.5BiniSt2haensdupLpalOem0.5eFn0.t5aBriy(Si1n−fyoSremy)a2t....
The crystallinity of the BTO films on PSO substrates was inferred from four-circle X-ray diffraction (XRD) measurements with a Cu Kα1 source (Supplementary Fig. 4). From reciprocal space maps of the BTO film around the PSO (332¯)O and PSO (240)O reflections, we concluded that the ...
之前看到薄膜的in-plane和out-of-plane XRD，这两种方法具体是指什么啊，有什么区别啊？
(0.507)]5as SRT2. The 2-D XRD spectra of the as-deposited stacks, including SRT1, SRT2, and Pt(4), all sputtered on the amorphous thermal oxide coated Si substrates (Fig.2b), exhibit all three textures from Pt and no significant Co-thickness-dependent intensity. This implies weak ...