In recent years, IEEE 1057-94 Standard [1] for specifying and testing measurement devices based on analog-to-digital converters (ADCs) earned the scientific interest in several topics. In particular, investigations showed the histogram test of the Standard to be insensitive to ADC hysteresis. In ...
IEEE Standard 1241-2010 [1] "Terminology and Test Methods for Analog-to-Digital Converters" defines terminology and specifications and describes test methods for measuring the performance of ADC's. The standard is written for manufacturers and users of ADC's for use in both static and dynamic ap...
The TC-10 ADC Subcommittee is coordinating with the IEC to insure that these two organizations can support one international standard for ADCs. In this paper, the basic contents of the standard are described followed by examples of applications of the test methods from the standard. Testing ...
The planning in this document was further influenced through guidance in IEEE Standard ... EL White 被引量: 0发表: 1994年 Improved determination of the best fitting sine wave in ADC testing The sine wave test of an ADC means to excite the ADC with a pure sine wave, look for the sine ...
e.g.,correctionforgainand offseterrors.Thisstandardalsopresentsterminologyanddefinitionstoaidtheuserindefiningand testingADCs. Keywords:ADC,A/Dconverter,analog-to-digitalconverter,digitizer,terminology,testmethods TheInstituteofElectricalandElectronicsEngineers,Inc. 3ParkAvenue,NewYork,NY10016-5997,USA Copyright...
7Information regarding the tools data base may be obtained from Data & Analysis Center for Software (DACS), RADC/ISISI, GrifÞss AFB NY 13441. 8Information regarding IEEE Computer Society publications may be obtained from IEEE Computer Society Order Department, PO Box 80452, Worldway Postal ...
A 64-MHz clock-rate ΣΔ ADC with 88-dB SNDR and-105-dB IM3 distortion at a 1.5-MHz signal frequency Gupta, SKFong, V 1653-1661 A 0.7-V MOSFET-only switched-opamp ΣΔ modulator in standard digital CMOS technology Sauerbrey, JTille, TSchmittLandsiedel, DThewes, R 1662-1669 A...
CC2538 ZHCSAU4A – DECEMBER 2012 – REVISED APRIL 2013 一一个个用用于于2.4GHz IEEE 802.15.4,,6LoWPAN 和和ZigBee 应应用用的的强强大大片片上上系系统统 查查询询样样品品: CC2538 1 特特性性 23 • 微微控控制制器器 (ADC) – 强强大大ARM Cortex™ M3,,具具有有代代码码预预提提取取功功能...
this standard also presents terminology and definitions to aid the user in defining and testing adcs. keywords: adc, a/d converter, analog-to-digital converter, digitizer, terminology, test methods the institute of electrical and electronics engineers, inc. 3 park avenue, new york, ny 10016-...
Both devices were set to output a 10-MHz clock signal for testing purposes. 表 23. Clock Synchronization Test Results(1) MEAN 1-σ STANDARD DEVIATION –226 ps 2.655 ns (1) Synchronized to master using IEEE 1588 PTP NO OF SAMPLES 1100 54 グリッド・インフラストラクチャ・アプリケ...