Optimization of FPGA-based test strategy for high resolution ADCDaniela De VenutoF DellOlioLeonardo Reyneri
关键词 测试方法高精度噪声 :ADC ; ; 中图分类号 文献标识码 文章编号 : : : () TN4312 A 1003353X201003026903 EffectiveResolutionTestMethodofHighResolutionADC , 12 1 HaoZhigang,YangHaigang ( , , ,; 1InstituteofElectronicsChineseAcademyofSciencesBeijing100190China , , ,) 2GraduateUniversityChinese...
The test time can be high for high-resolution ADCs. In this paper, a new DSP-based ramp test approach is presented to address the test time issue. The linear range of ramp the signal is divided into two parts and a sum of measured ADC outputs is calculated in each part. Signal ...
ENOB generally depends on the amplitude and the frequency of the applied sinusoidal input tone, and both must be specified for this particular test. This method compares the rms noise produced by the ADC under test to the rms quantization noise of an ideal ADC with the same resolution in bits...
This application note provides one approach to establishing dynamic performance parameters of a high-speed ADC quickly and precisely. Digital data can also be analyzed using a high dynamic performance, high-resolution DAC in combination with an output filter and ...
Available add-ons Advanced Security Enterprise-grade security features GitHub Copilot Enterprise-grade AI features Premium Support Enterprise-grade 24/7 support Pricing Search or jump to... Search code, repositories, users, issues, pull requests... Provide feedback We read every piece of ...
1.1 Hardware Setup To setup for the test, do the following: Place accelerometers and force cells on the structure. Mount shakers to the test structure. Connect shakers to an amplifier. Connect the output channels of the Simcenter SCADAS to the amplifier. ...
4815398 feat: make expression package return ErrExpressionResolution when resolution fails (#2292) 46e50da feat: make the assertion engine return a different error when no spans (#3666) 0c94f68 feat: metrics of pipeline steps (#3217) 5654831 feat: migrate transactions to new resourcemanager arch...
Powerful bank of processorsfor running the most advanced image test algorithms for high resolution devices High speed parallel data transferat 40Gbps per instrument Up to 80 sitesin parallel test Scalable computing and high data movement architectureensure the lowest cost of test across all sensor typ...
.duty_resolution = LEDC_TIMER_12_BIT, .timer_num = 0, .freq_hz = 2 * 1000, .clk_cfg = LEDC_USE_RTC8M_CLK, }; ledc_timer_config(&config); test_lightsleep(); } TEST_CASE("Power Test: Lightsleep (with ADC/TSEN in monitor)", "[pm]") { rtc_dig_clk8m_disable(); //This...