CG6300提供更高的解析度、测量再现性以及高画质高解析度FEB测量装置(CD-SEM)CG6300通过电子光学系统的全新设计提高了解析度,并进一步提高了测量可重复性和图像画质。 电子显微镜线圈能够选择从对象材料反射出的二次电子和背向散射电子,实现BEOL制程*1的Via-in-trench*2和3D-NAND、DRAM工程中的深沟槽・洞底的尺寸...
这台二手HITACHI CG6300高解析度FEB测量装置，不仅在国外保存得完好无损，更因其卓越的性能和稳定的测量精度，在全球半导体设备市场中占有一席之地。设备所具备的高解析度测量技术，可以精确捕捉到微小的电子束变化，为半导体制造过程提供了准确的数据支持。无论是研发阶段的材料分析，还是生产阶段的质量控制，它都能发挥...
日本日立HITACHI高解析度FEB测量装置CG6300,成都强势供应 价格:面议 最小采购量:不限 主营产品:电子产品、电子元器件、仪器仪表、五金交电,劳保用品、建材(不含危险化学品)、自动化设备 供应商:西崎贸易(成都)有限公司 所在地:中国 联系人:刘先生 联系电话 点此询价 QQ咨询 ...
Advanced CD Measurement SEM CG7300 For the EUV era device production – High Reliability CD-SEM Advanced CD Measurement SEM CS4800 A sustainable CD measurement solution to a wide range of 4, 6, and 8 inch wafer Fabs High Voltage CD-SEM CV7300 An in-line measurement system with 60kV ...
Hitachi CG-4000 Critical Dimension (CD) Measurement SEM Hitachi 6280H CONTROL RACK CD SEM (PARTS) SDI ID:90948 Manufacturer:Hitachi Model:I6300 Description:Defect Inspection Version:300 mm Vintage: Quantity:1 Sales Condition:as is where is ...
Lowering the energy of the electron beam ofCD-SEMcan reduce the damage to the sample due to charge-up or electron beam irradiation. CD-SEMmeasurement accuracy and repeatability is guaranteed by improving magnification calibration to the maximum extend. ...
TIP32CG FDMS8320LDC NCP1117DT18 MAX8986EWG+ MC33262DR2G 0257025.PXPV MBRD10100CT LXT384BE B1 NRF24L01 AX5043-1-TW30 NRF52832 SP724AHTP 1B24AT3G DS1666S-010 045106.3MR ICL7109CQH MC100EP32DT 5.0DJ14CA FOD8342TR2 MC34262P MAX4638ESE ...
型号:CG6300 测量对象:其他 供应商信息 公司地址成都市郫都区郫筒镇创智东二路58号1栋9层13号统一社会信用代码91510124MA63Q5J15U 组织机构代码MA63Q5J15注册资本100万人民币 营业期限50531-05-07至无固定期限经营状态存续 公司类型有限责任公司(自然人独资)成立日期2018-07-25 ...
Advanced CD Measurement SEM CG7300 For the EUV era device production – High Reliability CD-SEM Advanced CD Measurement SEM CS4800 A sustainable CD measurement solution to a wide range of 4, 6, and 8 inch wafer Fabs High Voltage CD-SEM CV7300 ...
Advanced CD Measurement SEM CG7300 For the EUV era device production – High Reliability CD-SEM Advanced CD Measurement SEM CS4800 A sustainable CD measurement solution to a wide range of 4, 6, and 8 inch wafer Fabs Advanced High Voltage CD-SEM “CV6300 Series” CV6300 Series is the ...