:Details how fault simulation is used to simulate a non-scan test vector of application specific integrated circuit (ASIC) for fault-coverage rather than logic-verification purposes. Use of scan testing by ASIC vendors to detect manufacturing defects; Purpose of the fault-coverage analysis; Kinds ...
前两种是in-field coverage enhancement,后一种是manufacturing coverage enhancement Test point inserting通过增加control/observe point来提高coverage,防止RP-resistant Mixed-mode BIST通过在pseudo-random pattern中加入一些deterministic pattern来提高coverage hybrid BIST是在tester上通过BIST和external testing的混合方式,通过...
Learning methods have been increasingly used in power engineering to perform various tasks. In this paper, a fault selection procedure in double-circuit transmission lines employing different learning methods is accordingly proposed. In the proposed procedure, the discrete Fourier transform (DFT) is used...
BUILT-IN-SELF-REPAIR FOR EMBEDDED RAMS WITH EFFICIENT FAULT COVERAGE USING PMBIST Built-In Self-Repair (BISR) with Selectable Redundancy is an effective yield-enhancement strategy for embedded memories. This paper proposes an efficient B... LD Teja,K Kiruthika,VP Brahmaiah - 《International Journ...
摘要: Proceedings : the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : DFT 2007 : 26-28 September 2007, Rome, Italy edited by Cristiana Bolchini ... [et al.] IEEE Computer Society, [c2007]DOI: 10.1109/dft12692.2007 ...
In a semiconductor design, keeping the design testable with high test coverage has always been a requirement. However with shrinking technology nodes and large, dense SoC designs and complex logic structures, while it has become mandatory to reach close to 100% test coverage, it’s extremely diff...
RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences Functional test sequences are often used in manufacturing testing to target defects that are not detected by structural test. However, they suffer from low... H Fang,K Chakrabarty,H Fujiwara - 《Journal of Electronic Test...
Delay testable enhanced scan flip–flop (DTESFF) has been proposed as a low cost DFT technique to achieve high TDF coverage using enhanced scan design without the need of fast hold signal. In this work, a partial DTESFF scheme augments few scan flip–flops with the DTESFF design by ...
数字集成电路可测性设计(DFT)讲义第8讲
Typically, using the LOS scheme to detect delay faults in a scan design or BIST design can achieve higher fault coverage than using the LOC scheme. The drawbacks of the LOS clocking scheme are that LOS can cause unwanted over-testing because more false paths may be exercised, and incur highe...