Systematic Methodology With DFT Rules Reduces Fault-Coverage Analysis.Awealth of information has been published on the design-for-test (DFT) rules that are necessary for high fault coverage. But what if the initial coverage is unacceptably low? For such cases there is hardly any information ...
Pontarelli et al.; " Optimization of Self Checking FIR filters by means of Fault Injection Analysis "; Publication Year: 2007; Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on; pp. ... S Pontarelli,L Sterpone,GC Cardarilli,... - Dft:...
BUILT-IN-SELF-REPAIR FOR EMBEDDED RAMS WITH EFFICIENT FAULT COVERAGE USING PMBIST Built-In Self-Repair (BISR) with Selectable Redundancy is an effective yield-enhancement strategy for embedded memories. This paper proposes an efficient B... LD Teja,K Kiruthika,VP Brahmaiah - 《International Journ...
Learning methods have been increasingly used in power engineering to perform various tasks. In this paper, a fault selection procedure in double-circuit transmission lines employing different learning methods is accordingly proposed. In the proposed procedure, the discrete Fourier transform (DFT) is used...
Hardware fault injection is the widely accepted approach to evaluate the behavior of a circuit in the presence of faults. Thus, it plays a key role in the design of robust circuits. This chapter presents a comprehensive review of hardware fault injection techniques, including physical and logical...
数字集成电路可测性设计(DFT)讲义第8讲
signduringtestpatterngeneration.Inthispaper,wefirstpresent acasestudyofaSOCdesignandshowdetailedIR-dropanalysis, measurementanditseffectsondesignperformanceduringat-speed test.Wethenproposeanovelmethodtomeasuretheaveragepower ofat-speedtestpatterns,referredtoasswitchingcycleaverage ...
The present invention generally relates to the field of logic design and test using design-for-test (DFT) techniques. Specifically, the present invention relates to the field of logic test and diagnosis for integrated circuits using scan or built-in self-test (BIST) techniques. ...
Exploring New Uses for the Veloce DFT App, Fault Coverage and Power Analysis
:Details how fault simulation is used to simulate a non-scan test vector of application specific integrated circuit (ASIC) for fault-coverage rather than logic-verification purposes. Use of scan testing by ASIC vendors to detect manufacturing defects; Purpose of the fault-coverage analysis; Kinds ...