PROBLEM TO BE SOLVED: To easily calculate the scale of a microscope with good accuracy without recognizing the comprehensive magnification determined from the magnifications, etc., of an objective lens and intermediate variable power device relating to a microscope system having a function to display ...
1. A reticle, comprising: a) a first horizontal cross-hair; b) a first vertical cross-hair that intersects said first horizontal cross-hair; c) two or more mil lines of graduated length on said first horizontal cross-hair; d) two or more mil lines of graduated length on said first ver...
A system for maintaining long‐term focus of samples under high‐magnification quantitative observation in an epi‐illumination optical microscope is descr... EH Hellen,D Axelrod - 《Review of Scientific Instruments》 被引量: 23发表: 1990年 APPARENT DOWNDRIFT IMPACTS OF T-HEAD GROIN CONSTRUCTION ...
PROBLEM TO BE SOLVED: To easily calculate the scale of a microscope with good accuracy without recognizing the comprehensive magnification determined from the magnifications, etc., of an objective lens and intermediate variable power device relating to a microscope system having a function to display ...
The invention relates to the field of microscope imaging technology, in particular to calculate the height of a glass slide and estimate the position of the glass slide in a microscope coordinate system by means of height values, under continuous scanning in the case of high magnification ...
A method for measuring and calculating the height of a microscope slide and estimating the position of the microscope slide in a microscope system based on the height is provided so as to obtain a clear image under continuous scanning at high magnification. In the present invention, a standard ...
A method for measuring and calculating the height of a microscope slide and estimating the position of the microscope slide in a microscope system based on the height is provided so as to obtain a clear image under continuous scanning at high magnification. In the present invention, a standard ...
A method for measuring and calculating the height of a microscope slide and estimating the position of the microscope slide in a microscope system based on the height is provided so as to obtain a clear image under continuous scanning at high magnification. In the present invention, a standard ...