World's Leading Research Atomic Resolution Microscope! Since its introduction, the JEOL ARM (Atomic Resolution Microscope) TEM/STEM product line has become the chosen platform for atomic resolution imaging/analytical research. The ARM product line is at the leading edge of research in the spherical ...
A New Atomic Resolution Electron Microscope has been released!The "GRAND ARM™2" has been upgraded.This new "GRAND ARM™2" enables observation at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating voltages....
Recent modifications to the JEOL ARM-1000 microscope have markedly enhanced its performance. The point resolution limit at 1000kV is confirmed by optical diffractograms down to 1.7 and there are firm indications of contrast transfer down to 1.4. The unique tilting capability of the ARM, ±40° ...
Here we describe how atomic resolution has been realised in the electron microscope and review the potential impact of this achievement on our understanding of materials. We emphasize the role of the microscope in clarifying the nature of local irregularities in the structure, since it is these ...
Asylum Research is the technology leader in atomic force microscopy (AFM). We are a manufacturer and supplier of atomic force microscope instruments and solutions.
In the 88 years since the seminal invention of the transmission electron microscope (TEM) by Ruska and Knoll in 19311, researchers have always pursued better and better spatial resolution. As electrons are charged particles, electromagnetic fields have been utilized as lenses for electrons following ...
(2001), Atomic Resolution Scanning Transmission Electron Microscopy. Phys. Status Solidi B, 227: 229–245. doi: 10.1002/1521-3951(200109)227:1<229::AID-PSSB229>3.0.CO;2-F Author Information Department of Physics, University of Illinois at Chicago, Chicago, IL, 60607-7059, USA Publication ...
G. Binnig, C.F. Quate, Ch. Gerber, Atomic force microscope. Phys. Rev. Lett. 49, 57 (1982). 1986年,Binnig和Rohrer 因发明 STM 而获得诺贝尔物理学奖。 1987年,Feenstra利用STM对砷化镓进行元素敏感成像。 M. Feenstra, J.A. Stroscio, J. Tersoff, A.P. Fein, Atom-selective imaging of the...
Detect surface structure, property, and functionality changes in engineered nanomaterials at sub-nanometer resolution with 3D AFM image scans. Mehr Polymers Correlate polymer structure, dynamic processes—including crystallization, phase separation, self-assembly, and electronic transfer—and function in real...
Cryo-EM structures at 1 Å resolution are currently not possible because they would require unrealistically high particle number statistics even with the Krios Mono/BCOR microscope (see Fig. 2). Extended Data Fig. 4 Structural features of our cryo-EM maps at 1.55/1.25 Å resolution compared ...