The definition of resolution is more complicated in the case of the electron image on account of the severe effect of lens aberrations, especially spherical aberration. Experimental measurement of the performance of an electron microscope requires an operational definition of resolving power, which must...
et al. Ultra-High Energy Resolution EELS. Micros. Microanal. 26, 1804–1805 (2020). Article Google Scholar Griillo, V. et al. Measuring the orbital angular momentum spectrum of an electron beam. Nat. Commun. 8, 15536 (2017). Article Google Scholar Download references Acknowledgements The...
Introduction toIn-SituElectron Microscopy(F Banhart) Observation of Dynamic Processes Using Environmental Transmission or Scanning Transmission Electron Microscopy(R Sharma) In-SituHigh-Resolution Observation of Solid-Solid, Solid-Liquid and Solid-Gas Reactions(H Saka) ...
An understanding of macromolecular structure is crucial for insight into the function of complex biological systems. Despite recent advances in single-particle cryo-electron microscopy (cryo-EM), the vast majority of high-resolution structures are determined by crystallographic methods (http://www.rcsb....
In 1990, Henderson succeeded in using an electron microscope to generate a three-dimensional image of a protein at atomic resolution. This breakthrough proved the technology's potential. Frank made the technology generally applicable. Between 1975 and 1986 he developed an image processing method in ...
Diagram of a light microscope with key elements highlighted. Electron microscope description In an electron microscope, an electron beam takes the place of the light source. Due to the wave-particle duality of electrons in a vacuum, they can behave just like the photons that make up light. ...
AScanning Electron Microscope(SEM) is a powerful magnification tool that utilizes focused beams of electrons to obtain information. The high-resolution, three-dimensional images produced by SEMs provide topographical, morphological and compositional information makes them invaluable in a variety of science...
About the Event The “Exploring Frontiers in Material Science through the Electron Microscope” conference will be held in April 22-25 at ShanghaiTech University, China. The conference is organized by School of Physical Science ...
Scanning electron microscopy (SEM) is an important tool for characterization of materials at the nanoscale. By using electrons instead of photons for imaging samples, SEM can achieve sub-nanometer spatial resolution1, revealing topological and compositional features invisible to traditional light microscopy...
However, the quantum control of strong-field processes at short wavelengths has not been possible, so far, because of the lack of pulse-shaping technologies in the extreme ultraviolet (XUV) and X-ray domain. Here, exploiting pulse shaping of the seeded free-electron laser (FEL) FERMI, we ...