At-Speed Transition Fault Testing With Low Speed Scan Enable - Ahmed, Ravikumar, et al. - 2005 () Citation Context ... possible between the victim and aggressor nodes is known, the worst case MCF can be derived using the MCF prediction model as described in the next section. n1 [0,0]...
atspeed transition fault testing：在速度转换故障检测
Scan design和logic bist是两种提高production quality的最重要的structure offline test techniques. 但是,随着工艺的复杂,100%的single-stuck fault coverage也能以保证perfect production quality。 The remaining faults包括:timing-independent(由于connection上的resistance越来越大)和non-single-stuck-at faults,non-feedb...
This paper examines the problem of exact delay fault grading in non-scan sequential circuits using a sequence of test patterns that are applied with a rated clock. Delay faults ending at flip-flops are latched as uncorrelated errors. The errors latched on flip-flops by previous tests may enhanc...
The most popular at-speed scan pattern is the transition pattern (Ref. 2). A potential fault of slow to rise (0 to 1) and slow to fall (1 to 0) is modeled at every gate terminal within the design. Automatic test-program generation (ATPG) tools target these fault sites and cause a...
At-speed transition fault testing with low speed scan enable A method and/or a system of at-speed transition fault testing with low speed scan enable is disclosed. In one embodiment, a digital system includes any num... CP Ravikumar,N Ahmed - IEEE 被引量: 95发表: 2007年 TEST SYSTEM ...
2.1 Stuck-at fault model The most common fault class is the stuck-at fault class. The fault model covers functional defects generated by shorts or opens in the device interconnect. ATPG programs always use the single stuck-at 0/1 fault model for the vector generation. 2.2 Transition delay ...
This fault is commonly caused by one of the following: A limit is configured on the user offline speed. Troubleshooting Flowchart The default user offline speed is 256 users per second on a BRAS. If users go offline at a speed lower than 256 users per second, the user offline ...
(2) A Write Recovery fault occurs when a value is read from a cell just after the opposite value has been written to a cell (along the same column and the bitline precharge has not been performed correctly). Obviously, the read operation must immediately follow the write operation. ...
In sub-threshold technology nodes, device failure due to timing related defects (setup & hold timing) is on rise due to extreme process variability and increasing use of voltage scaling techniques for achieving required performance. High coverage using stuck-at fault patterns, which can effectively ...